Used PHILIPS / FEI Phenom #9362022 for sale

PHILIPS / FEI Phenom scanning electron microscope (SEM) is a powerful instrument for surface analysis and imaging of a wide variety of samples with an unparalleled level of detail and accuracy. It is designed for nanometer resolution imaging with a field-of-view of up to 30 µm. This model uses a special electron-optical design to achieve high resolution and to provide greater stability during imaging. The innovative technology consists of a unique combination of an in-column primary electron lens and an in-column precession crusher lens for high magnification imaging of both large and small particles. FEI Phenom is capable of up to 20 nm resolution imaging and up to 2000X magnification for extremely detailed scans. Its specialized design includes a unique secondary electron detector to maximize signal response and to reduce sample damage in harsh operating conditions. This greatly enhances its capability for imaging delicate samples. Additionally, the user friendly software and automated features make operation fast and easy. The SEM also offers high speed image acquisition and the ability to promote images at full resolution in real time. The sample stage can easily be moved in the X-Y plane for precise alignment, and the high-speed scan mode allows for quick imaging. Additionally, the sample can be fine aligned with the optional alignment laser for maximum flexibility in sample movement and alignment. PHILIPS Phenom is perfect for surface analysis of a variety of samples, from organic objects to non-metallic materials such as ceramics, composites, and polymers. The superior resolution of the SEM allows for detailed imaging of features such as grain boundaries, fibers, and particles. Additionally, the large field-of-view and the enhanced signal-to-noise ratio make for enhanced resolution of thin layers and small features. Overall, Phenom is a powerful imaging and analysis tool for nanoscale imaging with a range of capabilities and features. It offers an advanced level of detail and accuracy as well as robust, easy-to-use software and automated operation. With its high resolution, broad field-of-view, and versatile design, it is an ideal tool for surface analysis, imaging, and nanotechnology applications.