Used PHILIPS / FEI Quanta 200 3D #9315970 for sale

PHILIPS / FEI Quanta 200 3D is a scanning electron microscope (SEM) that offers a range of features for imaging, analysis and metrology applications. It is a high resolution, Transmission electron microscope (TEM) that promises greater performance, accuracy and flexibility than other SEM models. As a secondary electron detector, FEI Quanta 200 3D features a Backscatter electron detector (BED) which features a hybrid configuration containing both a conventional BED and a high efficiency SuperFEG. PHILIPS Quanta 200 3D offers a maximum magnification of up to 500,000 times, delivering exceptional resolution. The instrument is equipped with a unique auto-alignment stage, allowing users to profile and automatically align sample structures quickly and accurately. Quanta 200 3D also features a 20kV fixed beam detector, ensuring excellent resolution and stability in imaging samples. In addition, the superior electron optics of PHILIPS / FEI Quanta 200 3D provide users with maximum flexibility for optimizing imaging parameters, such as the current supply limits and the source voltage. FEI Quanta 200 3D also features a high-speed CCD camera, allowing for real-time observation and analysis. The precision and stability of PHILIPS Quanta 200 3D makes it especially well-suited for imaging three-dimensional structures in operation environments. Its advanced features, such as the non-contact in-column detector and advanced image processing algorithms, enable users to accurately visualize and control complex, three-dimensional structures. Furthermore, Quanta 200 3D offers a range of options for beam analysis and metrology. These include the advanced electron backscatter pattern (EBSP) spectrometer, the energy dispersive X-ray (EDX) spectrometer and the Residual Gas Analyzer (RGA). By combining these options with the SuperFEG and the standard SEM detector, users can achieve fast, accurate data acquisition and analysis. In conclusion, PHILIPS / FEI Quanta 200 3D is a state-of-the-art scanning electron microscope that offers substantial advantages for imaging, analysis and metrology applications. The instrument's exceptional resolution, accuracy and flexibility makes it ideal for visualizing and controlling complex, three-dimensional structures, especially in complex operating environments. In addition, its advanced features provide fast, accurate data acquisition and analysis, and its range of beam analysis and metrology options enable users to profile and optimize sample characteristics quickly and without manual intervention. All in all, FEI Quanta 200 3D is a valuable, powerful tool in the modern laboratory.