Used PHILIPS / FEI Quanta 200 #293735981 for sale

ID: 293735981
Scanning Electron Microscope (SEM) HTSU Unit non-functional Dual anode source emission geometry Filament lifetime: >100 hours Detectors: Everhardt-Thornley SED Low vacuum SED (LFD) Gaseous SED (GSED) Solid-state BSED Gaseous analytical BSED (GAD) Vacuum system: 240 l/s TMP (2) PVP Beam gas path length: 10/2 mm Chamber: (8) Ports Left to right: 284mm Analytical WD: 10mm EDX Take-off angle: 35° 4-Axis motorized stage: Eucentric goniometer stage X,Y: 50mm Z: 50mm R: 360° Repeatability: 5µm Resolution: 3nm at 30kV (SE) 4nm at 30kV (BSE) 10nm at 3kV (SE) Accelerating voltage: 200 V - 30 kV Probe current: Up to 2µA System control: Keyboard Optical mouse Single frame (4) Quadrant image display (4) Quadrant live Graphical user interface: 32-Bit Operating system: Windows 2000 SP3.
PHILIPS / FEI Quanta 200 is a scanning electron microscope (SEM) designed for use in a variety of fields, including materials science, geology, and industrial research. It is equipped with a field emission gun (FEG) electron source, providing precision imaging at a high level of magnification. FEI Quanta 200 offers a range of unique features, such as high-resolution imaging systems, variable-pressures scanning capabilities, high-quality secondary and backscatter detectors, and a large standard sample chamber. PHILIPS Quanta 200 is a variable pressure SEM (VP-SEM), meaning that it allows users to select the operating pressure of the electron column. This is advantageous in the analysis of delicate specimens, as the reduction of pressure permits a greater range of analysis techniques, including those involving liquids and gas. Quanta 200 is equipped with SE and BSE detectors, which allow for the collection of backscattered and secondary electrons for the generation of high-resolution images. BSE detectors enable the collection of lighter electrons, which enable the detection of lower concentrations of elements. The SEM is also equipped with a focus ion beam (FIB) which can be used to precisely extract, collect and analyze a wide range of particles from the sample. The FIB is also capable of creating a cross-section sample, exposing various levels of detail within the sample. PHILIPS / FEI Quanta 200 is powered by the newest version of the Omega software, providing the user a multifaceted platform for the acquisition and analysis of signal images and data. The software allows for the integration of a wide range of signal and image processing tools, as well as the manipulation and analysis of acquired data. Finally, with its comprehensive range of features, FEI Quanta 200 is an ideal microscope solution for a variety of applications and research studies. Its high resolution, multiple detectors, and variable pressure capabilities all contribute to its ability to facilitate a broad range of research into different materials and substances.
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