Used PHILIPS / FEI Quanta 200 #293805589 for sale

PHILIPS / FEI Quanta 200 Scanning Electron Microscope (SEM) is a reliable and advanced imaging equipment designed for close-up inspection of materials and the analysis of surface characteristics. Utilizing a combination of advanced technologies, FEI Quanta 200 provides top-level performance in a cost-effective package. PHILIPS Quanta 200 utilizes a 200kV monochromatic field emission microscope column with a movable twin horizontal gun/stage, integrated phosphor screen and Peltier cooled camera system. With its integrated cold FEG technology, Quanta 200 offers superior image resolution of 190 nm and excellent depth of field at higher magnifications. This exceptional performance, coupled with the instrument's ease of use, provides the user with the capability to capture high definition images, non-invasively analyze surface morphology and characterize materials. PHILIPS / FEI Quanta 200 is designed for a variety of applications, including failure analysis, thin film inspection, corrosion mapping, residual stress detection, 3D topography and backscattered electron imaging. It supports a wide range of sample size and sample type, making it ideal for a variety of industries and research areas. The scan voltage and current can be adjusted from 0 to 200 kV and 0 to 1000 μA, respectively. The maximum scan rate is 2000 μm/s. The scanning electron signal is detected through the use of a single electron multiplier which is externally connected to the ST242/ST250/VA245 type converter electronics. FEI Quanta 200 is equipped with a unit control computer, which simplifies and increases the reliability of control operations. The control software is user-friendly and its open architecture supports numerous third-party applications. With such features as a built-in user protection machine and a comprehensive set of safety features, PHILIPS Quanta 200 Scanning Electron Microscope is the choice of many engineers, scientists, and researchers for investigating some of the most demanding sample inspection and analysis tasks.