Used PHILIPS / FEI Quanta 200 #9163542 for sale

PHILIPS / FEI Quanta 200 is a scanning electron microscope (SEM) designed for imaging, analysis, and measurement of a variety of materials at high resolution. FEI Quanta 200 employs an advanced digital signal processor (DSP) to generate crisp, high-contrast images of the sample surface. The DSP also enables a wide range of image acquisition modes such as ion-beam microscopy (IBM), secondary electron imaging (SEI), backscatter electron imaging (BEI), and X-ray microanalysis (XRM). PHILIPS Quanta 200 has a highly collimated, variable-current, field-emission gun for superior image resolution. The gun can generate backscatter electrons (BSEs) at very low voltages (up to 60 keV) to avoid sample charging and sample damage as well as secondary electrons (SEs) up to 30 keV. This combination of BSEs and SEs enables comprehensive imaging and high-resolution imaging capabilities. Quanta 200 also has a variable-angle BSE detector for SE contrast and stereo imaging, allowing 3D reconstruction. In addition, PHILIPS / FEI Quanta 200 provides an extensive X-ray microanalysis (XRM) capability that enables quantitative elemental, composition, and structural analyses. The XRM capacity features detection of X-ray spectra up to 400 keV, the ability to image single or multiple elements as well as Carbon, Oxygen, Nitrogen, and Phosphorus, and superior X-ray microanalysis software for advanced data processing.FEI Quanta 200 also has a built-in energy-dispersive X-ray spectroscopy (EDX) capacity that is adaptable to multiple different types of samples. Furthermore, PHILIPS Quanta 200 has a perfectly coupled low-vacuum environmental system that provides optimal imaging conditions for a variety of materials including metals and insulators. The system maintains a suitable level of vacuum for enhanced high-resolution imaging, while providing superior protection against irradiation damage to the sample. Finally, Quanta 200 is a highly sophisticated scanning electron microscope that combines an advanced digital signal processor, field-emission gun, variable-angle BSE detector, and X-ray microanalysis capability to make it a versatile and powerful research instrument. The SEM is ideal for researchers studying the composition, structure, and morphology of a variety of materials, and itsenvironmental protection system enables long-term imaging at ultra-high resolution.