Used PHILIPS / FEI Quanta 200 #9305909 for sale
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ID: 9305909
Environmental Scanning Electron Microscope (ESEM)
Everhart Thornley SE Detector (ETD) for high vacuum
Vacuum pump
Detector: ESEM Mode
Multi and single pin stub holder
Tungsten source
Motorized stages: X, Y, Z
(2) EDWARDS Rotary pumps for the vacuum
Accelerating voltage: 1-30 kV
Magnification range: 50x - 80,000x
Operating system: Windows 2000 professional
Image resolution options:
456 x 456 Pixels
684 x 684 Pixels
1024 x 1024 Pixels
2048 x 2048 Pixels
Faulty parts:
No communication with filament
Thermoelectric stage for use in ESEM mode non-functional
Starting process of XT microscope program stops at function.
PHILIPS / FEI Quanta 200 electron microscope is a high-performance scanning electron microscope (SEM) built to meet the stringent demands of modern research. It offers excellent topographical resolution and a wide range of scanning parameters, allowing a wide range of materials to be examined in great detail. FEI Quanta 200 has a maximum accelerating voltage of 40 kV, which is used to accelerate the beam of electrons to generate a highly detailed signal. With the sample in an ultra-high vacuum (UHV) environment, the precise control of the electron beam enables detailed imaging and analysis. An advanced image processor allows for the precise control of the scan parameters in order to adjust the energy dispersive spectrometry (EDS) signal spectrum for the best possible energy resolution. The resulting high-frequency image amplifier ensures images of unprecedented resolution, with excellent edge contrast and image drifting. The instrument also boasts an onboard SEM microanalysis system, with an integrated EDS detector and camera system allowing speed and high image capture rates as well as fast analysis of chemical elements. This coupled with 3D analysis capabilities makes PHILIPS Quanta 200 a powerful tool for SEM users. Quanta 200 also features a broad range of additional features, ideal for true-to-scale imaging. Its secondary electron (SE) detection system optimises incident beam lithography, while a longer working distance module can be attached for greater manipulation options in complex samples. Combining this wealth of features with advanced software control ensures PHILIPS / FEI Quanta 200's accuracy, reproducibility and reliability. The intuitive software even enables automated annotation and alignment, allowing users to quickly get an in-depth view of the sample, from the macro- to nanometre scale. Ultimately, FEI Quanta 200 scanning electron microscope is a powerful tool for researchers and scientists, enabling detailed imaging and analysis of a broad range of materials. With great accuracy, reliability and reproducibility, the microscope makes it easier to explore and uncover even the smallest details.
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