Used PHILIPS / FEI Quanta 200F #9362641 for sale

PHILIPS / FEI Quanta 200F Scanning Electron Microscope (SEM) provides versatile imaging for researchers and engineers in the fields of material science and industry. It offers a variety of imaging techniques to provide superior images of microstructures on the nanometer scale. FEI Quanta 200F has an SNR (signal-to-noise ratio) boosting In-Lens Secondary Electron Detector, achieving a resolution of 2 nm to enable detailed analysis of surfaces. This detector enables more electron-transparent samples to be imaged, which is ideal for characterizing microstructure features in semiconductor devices and biological specimens. The SEM has a sub nano-resolution, which is ideal for optimized surface imaging. It has a working distance ranging from 20 mm to 1 mm, which gives the user precise control over the microscope's operating distance and specimen imaging. The pressure-compensated Beam Blanking Electrostatic System helps reduce the effects of environmental vibration on specimen imaging. PHILIPS QUANTA 200 F has a variety of imaging modes to accommodate different research needs. It has low voltage backscattered electron imaging for topographical information, and variable pressure STEM mode with a large field of view for ultra-high resolution imaging. Users can image the structure of a sample with the Nomarski Differential Interference Contrast mode. The automated fine-tuning collimator, electron beam size, acceleration voltage and detector sensitivity features make PHILIPS Quanta 200F highly versatile. For instance, the user can adjust the features to obtain the best image quality with the least amount of time. Quanta 200F scanning electron microscope is a powerful instrument, suitable for a wide range of applications across a variety of industries. It offers a high resolution image, along with a versatile set of imaging modes and automated fine-tuning features to make it a great choice for examining microstructures and materials.