Used PHILIPS / FEI Quanta 250 FEG #293814041 for sale

PHILIPS / FEI Quanta 250 FEG is a Scanning Electron Microscope (SEM) that allows for the high resolution imaging of samples. Using electron beam technology, it is able to magnify objects up to 250,000x their actual size. It is equipped with an ultra-fast Field Emission Gun (FEG) which gives the microscope the capability to achieve visuals with impressive speed and resolution. This also enables the Quanta 250 to perform a variety of analytical measurements such as energy dispersive spectrometry (EDS). The Quanta250 comes with advanced imaging options such as motorized XY control stages allowing the user to quickly adjust the sample focus, automated tilt & alignment operation that helps acquire high-resolution tilts images quickly and Altissimo contrast method that allows visualization of sample details in three spatial dimensions with depth. In addition, the microscope is capable for quick image acquisition at high resolutions which is suitable for applications such as point analysis and image mapping. The Quanta 250's imaging features include a dedicated SEM with an electron beam control system, secondary and backscattered electron detectors, an energy-dispersive X-ray detector (EDX) and a low-vacuum mode for high-resolution images. Furthermore, the Quanta 250 has built-in sample cooling capabilities which prevent distortion or damage to the sample that can occur during extended imaging sessions. Additionally, the FEG also provides a range of operating currents powered by a high-gain voltage supply which can generate high resolution images even at low magnifications. FEI Quanta 250 FEG is a great choice for a broad range of applications such as failure analysis, quality control, materials characterizing, non-destructive testing and nanometrology. With features such as UV interactive wafer control, dual monitor display, and an intuitive touch screen interface, PHILIPS Quanta 250 FEG scanning electron microscope is an efficient and reliable tool for imaging and analysis.