Used PHILIPS / FEI Quanta 250 #9195113 for sale

PHILIPS / FEI Quanta 250 is a scanning electron microscope (SEM) designed primarily for the imaging of nano-scale features. This advanced instrument features various high-performance components, such as a field emission gun (FEG), a liquid nitrogen cooled electron detector and an ultra-high-resolution imaging system. The FEG produces a focused, high-resolution electron beam, which is used for imaging surfaces of samples ranging from several millimeters to a few nanometers in size. The electron beam is focused over a wide range of magnification, allowing for large-scale overview images and nanoscale detail. The detector is a liquid nitrogen cooled thin film detector, which is capable of detecting secondary electrons, backscattered electrons, and characteristic x-rays. Furthermore, FEI Quanta 250 features an ultra-high-resolution imaging system, which produces images with a resolution on the order of 0.1 nm. In addition to imaging surfaces, PHILIPS Quanta 250 is capable of 3D reconstructions for samples with thicknesses of up to 200 µm. This is accomplished by acquiring multiple numbers of images at different incident angles and then combining them into a 3D data set. The instrument can also be used for a variety of analytical processes, including sample analysis in vacuum, surface analysis and characterization in real-time, rapid elemental mapping, detecting line defects, examining grain boundaries, and discriminating individual phases in polycrystalline materials. Quanta 250 also features a variety of user-activated controls, such as a sample stage goniometer which provides 360° rotational and tilt control, a cellular-level auto alignment system, control of biasing voltages up to 5 kV, a semiautomatic sample selection, a multielemental detector, fast data acquisition speeds and 3D reconstruction software. As a result, PHILIPS / FEI Quanta 250 is designed to provide intuitive and highly accurate imaging of nano-scale features.