Used PHILIPS / FEI Quanta 250 #9195741 for sale
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ID: 9195741
Vintage: 2013
Scanning electron microscope (SEM)
P/N: 1027641
FEG D8421
Source: Field emission gun assembly
With schottky emitter source
Resolution:
High vacuum mode:
1.2 nm at 30 kV (SED)
2.9 nm at 1 kV (SED)
High vacuum mode with options:
1.0 nm at 30 kV
2.5 nm at 30 kV
0.8 nm at 30 kV
3.0 nm at 1 kV
2.3 nm at 1 kV
3.1 nm at 200 V
Low vacuum mode:
1.4 nm at 30 kV (SED)
3.0 nm at 3 kV (SED)
Low vacuum mode with options: 2.5 nm at 30 kV
Extended vacuum mode (ESEM): 1.4 nm at 30 kV (SED)
Focus range: 2.5 - 99 mm
Magnification: 20x - 2000000x
Field of view:
High and low vacuum modes: 21 mm
Secondary electron (SE) detector
500 pm with standard
Axial
Gaseous
Scanning system:
Pixel density: 768 x 512, 1536 x 1024, 3072 x 2048 or 6144 x 4096
Minimum dwell time: 50 ms / pixel
Maximum: 25 ms / pixel
Electronic scan rotation: n x 360°
DCFI (Drift compensated frame integration)
P/N / Description
FP 6842/22 / Beam deceleration
FP 2304/17 / Low-kV SSBSED
FP 2304/11 / GAD Low-kV SSBSED
FP 2304/16 / ESEM GAD Detector
FP 2304/23 / Low-kV, high contrast detector (vCD)
FP 2303/00 / Gaseous BS detector
FP 6901/30 / Centaurus detector with back scatter tip
FP 6902/30 / Cathode luminescence tip for centaurus detector
FP 2310/00 / PMT Detector interface
FP 6843/52 / 6-Channel detector amplifier
FP 2303/04 / Wet stem
FP 2300/12 / PELTIER Stage
FP 2300/42 / PELTIER / Heating stage control kit
9432 909 96541 / CRYO Can
FP 6761/46 / Nav-cam 250
1018263 / Windows 7 support PC
FP 2311/01 / Joystick
FP 2311/05 / Manual user interface
9432 909 96411 / Compressor 120 V, 60 Hz with 4-liter tank
(2) 9425 060 99100 / On-site Training / Supports
4022 404 41091 / Installation labor quanta 250 FEG NA
4022 404 02091 / Installation material quanta 250 FEG NA
Voltage: 200 V - 30 kV
Beam current: 200 nA
2013 vintage.
PHILIPS / FEI Quanta 250 is a top of the line scanning electron microscope (SEM) suitable for advanced research and industrial applications. Utilizing a powerful tungsten filament x-ray source and a five-quadrant tail-electron flood gun, FEI Quanta 250 is capable of handling even the toughest primary electron imaging tasks. Its imaging capabilities are further bolstered by a high resolution, low-vacuum column design that allows for superb high-contrast imaging at accelerating voltages ranging from 1 to 30 keV. In addition to its imaging capabilities, PHILIPS Quanta 250 is equipped with several EDX detectors including a HARPES detector located beneath the center of the column and a GATAN DigitalMicrograph equipment for automated analysis. This ensures that users can accurately identify and analyze their samples, allowing them to study elemental composition in a type of SEM that is not possible with regular electron microscopes. The EDX detectors also come with an integrated imaging and sputter Coater system which helps preserve sample integrity and facilitates the delivery of high-resolution images with minimal sample preparation. Other features included in Quanta 250 are a detection range of 20nm to 5 microns, an image resolution of 1 nanometer at 30KV, a deflector unit for tilt and scan control, and an integrated vacuum pumping chamber. The detector also has the ability to include Faraday cups and secondary electron detectors which improve its resolution and energy resolution. The integrated vacuum pumping unit ensures that users can work in the lowest vacuum, minimising contamination and improving the accuracy of the machine. PHILIPS / FEI Quanta 250 is an incredibly powerful and versatile light source that is perfect for electron imaging, analysis and sorting applications. With its extensive range of imaging capabilities, EDX detectors and integrated vacuum pumping tool, it is capable of providing precise images with unbeatable accuracy. It is the perfect tool for any research or industrial application that needs unparalleled imaging technology and exquisite detail.
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