Used PHILIPS / FEI Quanta 3D FEG #293600869 for sale

PHILIPS / FEI Quanta 3D FEG is a field emission gun (FEG) scanning electron microscope (SEM) that provides ultra-high resolution imaging and analysis. This advanced imaging system provides pictures of the specimen at nanometer resolution. It also offers a wide range of inspection capabilities, such as elemental composition analysis, mapping of the surface topography, and volatile material analysis. FEI Quanta 3D FEG utilizes a field emission gun (FEG) to generate a beam with a very small electron probe. This tightly focused beam provides atomic-level detail of the material being inspected, enabling the user to identify material defects of considerable size and other features that are not visible with conventional SEM systems. The beam control system of PHILIPS QUANTA 3 D FEG ensures a stable beam profile and more accurate imaging results. PHILIPS / FEI QUANTA 3 D FEG allows users to analyze a wide range of materials, from insulators to conductors and semiconductors. This includes high resolution observation of nanostructures, trenches, surfaces and microscopic features of a variety of thin film materials. Furthermore, the system's electron beam can interact with the sample to provide information on elemental composition and crystalline structures. QUANTA 3 D FEG is equipped with numerous imaging and analysis functions, allowing users to detect a wide range of material properties. This includes, but is not limited to, electron backscatter diffraction, energy dispersive X-ray spectroscopy, shape recognition and quantification, thin film analysis, and imaging augmented by a range of quantitative measurement software. Overall, FEI QUANTA 3 D FEG is a powerful scanning electron microscope ideal for applications in materials science, life sciences and nano-engineering. This cutting-edge technology offers superior performance, stability, and flexibility for a wide range of high resolution imaging and elemental composition analysis.