Used PHILIPS / FEI Quanta 3D FEG #293669806 for sale

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ID: 293669806
Focused Ion Beam (FIB) system.
PHILIPS / FEI Quanta 3D FEG is a comprehensive high-performance Scanning Electron Microscope (SEM) developed for imaging and analysis of a wide range of materials and applications. This device offers excellent flexibility, advanced imaging capabilities, and robustness for advanced applications and research. FEI Quanta 3D FEG has a unique design, featuring two lens systems and a nanoscale field-emission gun (FEG). This combination allows a high degree of magnifying power and a wide range of resolutions. The field emission gun (FEG), offers several advantages, including a high viewing angle, low beam current, and very low background noise. It also provides a wide range of magnification power, with up to 200,000x magnification available. The FEG's long lifetime, low amperage and high resolution make it perfect for a variety of imaging applications. PHILIPS QUANTA 3 D FEG is designed to serve both analytical and imaging needs, allowing users to get detailed information on samples. Its advanced software helps to analyze data in different ways, helping users to quickly access the required results. The microscope is also automated, allowing easy access to different imaging and analysis parameters and a variety of different imaging modes. QUANTA 3 D FEG also offers a range of accessories including a complete range of detectors, such as the secondary electron detector, backscattered electron detector, and array of additional energy-dispersive detectors. These help to accurately measure and quantify the elemental composition of a sample. Additionally, FEI QUANTA 3 D FEG has a unique semi-automated sample preparation system, which helps to maintain the sample environment and reduce the time taken to analyze a sample. Finally, the microscope features an integrated software package that allows users to control all of the microscope's settings, including image size, brightness, contrast, and more. In conclusion, PHILIPS / FEI QUANTA 3 D FEG is a comprehensive, high-performance Scanning Electron Microscope that offers excellent flexibility, advanced imaging capabilities, and robustness for advanced applications and research. This Scanning Electron Microscope is an ideal choice for imaging materials and analyzing samples on the nanoscale.
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