Used PHILIPS / FEI Quanta 3D FEG #9237481 for sale

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PHILIPS / FEI Quanta 3D FEG
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ID: 9237481
Focused Ion Beam (FIB) system SEM+ Ion column Omni probe system: Manual type GIS, PT.
PHILIPS / FEI Quanta 3D FEG is an advanced scanning electron microscope (SEM) that allows for unprecedented 3D imaging of materials using a variety of analytical techniques. It has excellent resolution of 0.7 nm for the collection of high-resolution images and elemental maps. FEI Quanta 3D FEG is capable of detecting nanoscale features, distortions, and molecular structures in challenging environments such as their resolution test results and sample thickness make it ideal for applications such as semiconductor lithography, circuit board analysis, metallographic studies, and failure analysis. It can also be used for evaluating surface roughness, contamination levels, and corrosion states. PHILIPS QUANTA 3 D FEG utilizes a field emission gun (FEG) also known as a cold cathode emission gun. This advanced technology enables the microscope to provide improved performance on both low and high voltage imaging. This is due to the ability of the FEG to maintain a very stable and consistent primary beam current over a broad range of operating voltages which results in better image quality and stability. Additionally, the gun has a finely focused beam that facilitates the analysis of small features as well as the detection of imperfections in large areas. The microscope is equipped with a variety of advanced features to ensure maximum performance and to provide a complete workflow. These features include a fully automated specimen exchange system, a high-speed scan controller, a quick scan system, and an automated low-voltage backscatter detector. It also has an automated sample temperature and gaseous environment control system that allows for optimal analysis of even the most challenging samples. Quanta 3D FEG also offers excellent image contrast and signal-to-noise ratio that allow for valuable information to be retrieved from a range of specimen surfaces. The flexibility of the microscope also provides the user with the ability to adjust the operating voltage to acquire a wide range of signals. This versatile tool offers excellent resolution and superb imaging capabilities, making it the ideal choice for any microscopy application. From failure analyses and semiconductor production to high-resolution imaging and 3D imaging, PHILIPS / FEI QUANTA 3 D FEG provides reliable results with ease and accuracy.
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