Used PHILIPS / FEI Quanta 3D FEG #9266789 for sale
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ID: 9266789
Dual beam SEM
Ion beam resolution: 7 nm at 30 kV (Beam coincident point)
Electron beam resolutions:
High vacuum
0.8 nm at 30 kV (STEM)
1.2 nm at 30 kV (SE)
2.5 nm at 30 kV (BSE)
2.9 nm at 1 kV (SE)
Low vacuum:
1.5 nm at 30 kV (SE)
2.5 nm at 30 kV (BSE)
2.9 nm at 3 kV (SE)
Extended low vacuum mode (ESEM)
1.5 nm at 30 kV (SE)
Chamber vacuum:
High vacuum: < 6e-4 Pa
Low vacuum: 10 to 130 Pa
ESEM Vacuum: 10 to 4000 Pa
Pump down time (high-vacuum): < 3 Minutes
Power supply:
Accelerating voltage: 200 V - 30 kV
Probe current: up to 200 nA.
PHILIPS / FEI Quanta 3D FEG is a field-emission scanning electron microscope (FE-SEM) that enables ultra-high resolution imaging of materials across all fields. This versatile instrument combines the advanced field emission gun (FEG) technology of FEI with the robust scanning electronics of PHILIPS to provide a powerful imaging platform for nanoscale imaging and analysis. FEI Quanta 3D FEG is a compact equipment that features high-resolution imaging at a resolution of up to 1 nanometer. With a wide field-of-view of up to 50 millimeters, this system is capable of capturing large areas of a sample in great detail with a single scan. The instrument is designed to easily acquire images of even the most complex three-dimensional structures. The instrument features an automated specimen stage that can move up to 150-mm in the x, y, and z axis, which helps facilitate large field-of-view imaging. The unit also comes equipped with an advanced electron-column control, which facilitates automated optimization of the optimal imaging conditions for vastly different materials. This allows for routine users to easily acquire high-quality results. The Quanta 3D also features a versatile automated specimen handling machine. This advanced technology can alter the sample placement for different types of imaging such as low voltage secondary electron, strong in-lens secondary electron, and backscatter electron imaging. The Quanta 3D can also perform advanced Elemental Analysis (EDX and EBSD) and Ion Beam Analysis (IBM and ISS) to acquire composition information and sub-micron details. In addition to its many features, the Quanta 3D also includes various software packages that enable advanced data analysis and manipulation. The software enables users to access 3D reconstructions, surface profiling, and digital image processing. These features make the Quanta 3D an ideal instrument for imaging and characterization of a wide range of materials.
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