Used PHILIPS / FEI Quanta 3D FEG #9272543 for sale

PHILIPS / FEI Quanta 3D FEG is a high-performance scanning electron microscope (SEM) that features a Field Emission Gun (FEG) for ultimate image quality and resolution. The solution combines advanced imaging and analytical capabilities to help unlock valuable insights from micron-scale 3D structures and materials. With its advanced user interface, FEI Quanta 3D FEG enables users to quickly and easily set up and take stunning 3D images in a wide range of applications across a variety of scientific and industrial disciplines. PHILIPS QUANTA 3 D FEG is designed to be used in a range of applications, such as material analysis, thin-film characterization, and topography measurement. It is capable of achieving low-kV imaging for extended working distances and high-kV imaging for detailed resolution of fine structures and features. Its integrated state-of-the-art e-beam technology provides the ability to take fast and accurate measurements of three-dimensional structures. The FEG is the most important feature of QUANTA 3 D FEG. The FEG is a type of electron source which uses electric fields to emit high-energy electrons from a cold metal tip, which is held in place by an insertable cartridge. Unlike traditional electron sources which use a heated filament to generate electrons, the FEG allows for much higher resolution images. This is a result of the low-energy electrons which are emitted from its cold metal tip. PHILIPS / FEI QUANTA 3 D FEG also features an integrated alarm and automated gas exchange system. This system ensures stable vacuum for optimal performance in both high and low vacuum SEM modes. Quanta 3D FEG is built on an open platform, which makes it easily configurable to meet the needs of a wide range of applications. The platform also boasts a unique modular design, making it even easier to explore new applications with confidence. FEI QUANTA 3 D FEG also offers a wide range of automated features. These include automated image optimization tools, automated image quality control, and automatic drift correction. Additionally, the SEM features a full suite of complementary analytical attachments which facilitate a range of characterization techniques, including Energy Dispersive X-ray Analysis (EDXA), and Electron Backscatter Diffraction (EBSD). PHILIPS Quanta 3D FEG is an advanced imaging and analytical tool that is capable of making valuable contributions to research and discovery in a wide range of fields and industries. It is an intuitive user interface and a range of powerful features make it an ideal solution for those looking to unlock the secrets of nanoscale structures and materials.