Used PHILIPS / FEI Quanta 400HV #9361957 for sale

PHILIPS / FEI Quanta 400HV scanning electron microscope (SEM) is an incredibly powerful instrument for scientific research. It is designed for high-resolution imaging, elemental microanalysis, and electron beam lithography. This microscope is capable of achieving resolutions as low as 2 nm and permits rapid image acquisition. It integrates advanced, field-proven technologies to meet researchers' demands for high performance, reliability, and total flexibility. FEI Quanta 400HV employs a uniquely shaped, high tension column with a low thermal budget. This creates a consistently high beam quality whilst minimizing the chance of heat accumulation. Additionally, its unique beam tension equipment decreases chamber diffusion heating, allowing for maximum beam stability for high resolution imaging and accurate microanalysis. Furthermore, the integrated field emission gun facilitates extractionefficiencies up to 50 times higher than conventional thermionic sources, with a beam current of up to 250nA. For imaging, PHILIPS QUANTA 400 HV uses a high contrast, CBS/SE2 dual detector system which allows for simultaneous imaging in both backscattered and secondary electron modes. This helps to assure contrast control between high and low atomic elements and offers a wide range of well-resolved contrast options. These detectors also have adjustable voltage probes, enabling the use of variable accelerating voltage for higher contrast imaging. The instrument also comes with a variety of optional accessories for extended capabilities. These include a high resolution CCD camera, a robotic sample stage, and a gas injection unit for sample cooling. The in situ sample transfer machine is also highly convenient and allows for the rapid and accurate transfer of samples in a vacuum, improving the reliability and accuracy of measurements. This makes Quanta 400HV an ideal tool for a wide range of research applications. In conclusion, QUANTA 400 HV scanning electron microscope is a powerful and reliable instrument for imaging, microanalysis, and electron beam lithography. Its unique column, field emission gun, and CBS/SE2 dual detector tool provide superior resolution, reliability, and selectable imaging options. Additionally, its robust accessories further extend its range of capabilities, making it an ideal choice for high-end scientific research.