Used PHILIPS / FEI Quanta 450 #9200223 for sale
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ID: 9200223
Vintage: 2012
Scanning Electron Microscope (SEM)
Nano characterization:
Metals and alloys
Oxidation / Corrosion
Fractures
Welds
Polished
Sections
Magnetic
Superconducting materials
Ceramics
Composites
Plastics
Film / Coatings
Geological sections
Minerals
Nanoprocesses:
Hydration / Dehydration
Wetting behaviour / Contact angle analysis
Oxidation / Corrosion
Tensile (Heat / Cooling)
Crystallization / Phase transformation
Soft materials:
Polymers
Pharmaceuticals
Filters
Gels
Tissues
Plant material
Particles
Porous materials
Fibers
Nano prototyping:
Lithography
EBID
Essential specifications:
Electron optics:
High performance thermal emission SEM
Fixed objective aperture
Objective lens geometry: 45°C
Maximum horizontal field width: 6.5 mm
Distance (10 mm): 24.3 mm (65 mm)
Accelerating voltage: 200 V - 30 kV
Probe current: Up to 2 µA
Magnification: 6 -1000000 x
Electron beam resolution:
High vacuum:
3.0 nm - 30 kV (SE)
4.0 nm - 30 kV (BSE)
8.0 nm - 3 kV (SE)
Extended vacuum mode (ESEM):
3.0nm - 30 kV (SE)
Detectors:
Everhart thornley SED (secondary electron detector)
Large field low vacuum SED (LFD)
High sensitivity low kV (SS-BSED)
Gaseous SED (GSED) (used in ESEM mode)
4-Quadrant solid-state (BSED)
Scintillator (BSED / CLD)
IR Camera for viewing sample in chamber
Vacuum system: 1 x 250 l/s TMP (Turbomolecular pump)
Beam gas path length: 10 mm / 2 mm
Chamber vacuum:
High: < 6e - 4 Pa
Low: < 10 - 130 Pa
ESEM: < 10 - 2600 Pa
Evacuation time:
High vacuum: ≤ 150 s
ESEM (FEI Standard test procedures): ≤ 270 s
Chamber:
Size: Left to right 284 mm
Analytical WD: 10 mm
(8) Ports
EDS take-off angle: 35°C
Stage:
X-Y: 100 mm
Z: 60 mm
Z clearance: 75 mm
T: - 5° - 70°
R: 360°
Repeatability: 2 µm (x - y)
Sample holders:
Multi-stub
Single stub mount
Various wafer and custom
Universal sample
System control:
32-Bit graphical user interface: Windows XP
Keyboard and optical mouse
LCD Display, 19"
SVGA 1280 x 1024
Joystick
Manual user
Image processor:
4096 x 3536 Pixels (~14 MP)
File type:
TIFF (8 / 16 bit)
BMP / JPEG
System options:
Manual user interface
Support PC (Monitor, 19")
2012 vintage.
PHILIPS / FEI Quanta 450 is a scanning electron microscope (SEM) designed for high-sensitivity imaging and analytical applications. Its high-resolution images make it ideal for inspecting microstructures in samples with nanoscale dimensions. The microscope includes a monochromated high-tension electron gun, a full suite of variable voltage imaging and secondary electron (SE) detectors, powerful detection software, and digital image processing capabilities. FEI Quanta 450 is a powerful high-performance SEM, suitable for a wide range of applications such as semiconductor failure analysis, material structure analysis and non-destructive material testing. The system is capable of resolutions down to 1.1 nm, allowing high precision imaging of nanoscale structures. The microscope contains a Zeiss ECU-D1 monochromated electron gun. This field-emission electron source has a 1 nm spot size, high stability and reproducibility and low thermal emittance. The source is mounted on an X-Y manual motion mechanism, allowing it to be accurately placed over the sample, resulting in low drift and high accuracy. PHILIPS Quanta 450 includes a full suite of SE detectors, including a secondary electron detector (SED) and backscatter electron detector (BSD). The detectors are mounted on a Y-Z manual motion mechanism, allowing them to be accurately positioned around the sample. This enables precise elemental identification of the structure with small volumes. The software installed with the microscope makes it easy to operate. It includes two-dimensional imaging, three-dimensional (3D) reconstruction, sample positioning, and energy-dispersive X-ray spectroscopy (EDS). The imaging portion of the software is flexible and user friendly, allowing for a wide range of image settings and enhancements. The digital image processing capabilities of the microscope are robust, providing the user with a range of features such as advanced image segmentation, quantitative image analysis, and histogram analysis. This imaging is essential for sophisticated applications in failure analysis. Overall, Quanta 450 is an advanced scanning electron microscope designed for high-resolution imaging and analysis of nanoscale structures. The monochromated electron gun with its 1 nm spot size, full suite of SE detectors, software, and digital image processing system make it ideal for inspecting microstructures in semiconductor, material and device samples.
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