Used PHILIPS / FEI Quanta 600 #9184612 for sale

PHILIPS / FEI Quanta 600 is a scanning electron microscope (SEM) that utilizes a unique combination of beam technologies aimed at providing the highest possible level of resolution. SEMs are used to characterize a variety of materials, including nanoparticles, nanocrystals, metals, and polymers. They are also employed to study surface topography, crystal defects, and grain boundaries. The high resolution results generated by this SEM are made possible by several beam technologies, including field emitters, which allow for high quality imaging without sample charging; variable pressure ion sources, which provide low sample damage and improved imaging quality; and field emission gun technology, which helps to reduce image blur. FEI Quanta 600 is a dual beam scanning electron microscope with a unique combination of electron beams, each of which can be independently controlled to enable 3D imaging with very high resolution. The microscope features an advanced beam focusing system, which is capable of imaging minute details. In addition, a wide variety of sample preparation techniques, such as sputtering, are available in order to prepare more complex samples. This SEM also features advanced imaging modes, such as variable pressure environmental imaging, which is a specialized task for studying fragile and organic materials. Furthermore, it is equipped with an digital oxide field emitter microscope detector which allows for high-contrast imaging of nanoscale features. PHILIPS Quanta 600 stands out for its advanced design that features three independent scanning electron beams. This allows for simultaneous imaging of multiple samples with single scan, resulting in greatly improved throughput. The microscope also offers a comprehensive suite of software for image analysis and manipulation, such as the Quantum Analysis Software (QAS). This software includes advanced features for measuring, controlling and analyzing images. Quanta 600 SEM is an impressive instrument for advanced electron microscopy, providing researchers with the highest resolution, widest variety of imaging modes, and most comprehensive software package for image manipulation and analysis available. It is a powerful tool for characterizing complex materials, with particular applications in nanotechnology.