Used PHILIPS / FEI Sirion 200 #9267884 for sale

PHILIPS / FEI Sirion 200 is a highly advanced scanning electron microscope (SEM) used for observing and analyzing the structural features of specimens. Its flexible, user-friendly design allows for a variety of applications, such as cross-sectional imaging, analysis of nanomaterials, and scanning electron microscopy (SEM) imaging for determining the quality of a wide range of materials. This SEM is equipped with a tungsten filament gun and a type of electron detector, giving excellent brightness, contrast, and resolution. The advanced feature of the gun allows for a high-quality imaging of nanoscale particles, as well as nanostructures. This allows researchers to accurately assess the texture, composition, and other features of the samples they study. This SEM is also capable of collecting both large and small samples, due to its highly advanced sample changing system. This allows researchers to quickly and accurately analyze a wide range of specimens with varying material characteristics. FEI Sirion 200 is also equipped with a computerized image analysis module, marking a dramatic improvement in image stitching and image analysis capabilities. This module is capable of accurately determining the elemental composition of samples, therefore aiding in the evaluation of the structure and composition of the samples. PHILIPS Sirion 200 also has extremely capable environmental and electrical testing capabilities, allowing researchers to quickly analyze their specimens for any defects or abnormalities. Sirion 200 also has the capability to operate in a high-vacuum environment, which is important for certain delicate imaging and analysis processes. This scanner is also equipped with a variety of other features, such as dual-beam SEM imaging, directional beam SEM imaging, digital zoom, 3D image analysis, and data acquisition and storage. The instrument has the ability to store functions, thus allowing users to easily recall work that has been stored. Overall, PHILIPS / FEI Sirion 200 is an extremely powerful and versatile SEM that is highly capable of providing detailed images and analysis of a variety of specimens. Its user-friendly and advanced features make it a great choice for researchers and scientists who need to quickly and accurately analyze their specimens.