Used PHILIPS / FEI Sirion 400 #293830599 for sale

PHILIPS / FEI Sirion 400 is a high-resolution scanning electron microscope (SEM) capable of producing the highest resolution images currently available on the market. FEI Sirion 400 is equipped with a Schottky field-emission gun (FEG) electron source which provides exceptional power for excellent image contrast. This system is able to produce details as small as 2 nanometers. This means scientists and researchers can observe and study the smallest details available. PHILIPS Sirion 400 is also incredibly precise, allowing users to accurately measure particles and surfaces that cannot be seen with the naked eye. With its variable working distance, sample sizes ranging from 0.1 nanometers to 20 centimeters can be seen. The electronic detector of Sirion 400 is highly sensitive, making it ideal for delicate research projects such as biological specimen analysis. With the dual-beam detector (DMD) that can be incorporated into the system, a user can gather both low and high-resolution images of the sample. PHILIPS / FEI Sirion 400's large chamber is designed to accommodate larger samples such as rocks, soils, sediments, and fibers. Its fast scanning speeds combined with the auto-focus lens allows for high-speed imaging, and with its onboard software users can quickly and accurately determine the exact location of the scanned material. A multiple-sample changer can now be installed for reduced set-up and operation times. Users can either view the sample in a conventional view or in a specialized 360-degree view for a more precise analysis. The advanced laser alignment system ensures that each scan is perfectly matched to the previous one, which minimizes any error when stitching together images. FEI Sirion 400 is a powerful and precise scanning electron microscope that is perfect for researchers and scientists looking to view and analyze the tiniest of objects. With its high-resolution camera, multiple-detector capabilities, and its advanced scanning speed, this instrument will allow researchers to capture detailed images and measurements of their sample material.