Used PHILIPS / FEI Sirion #9039275 for sale
URL successfully copied!
Tap to zoom
ID: 9039275
Scanning Electron Microscope (SEM)
Includes:
(2) Modes: Ultra High Resolution (UHR) and High Resolution (HR)
Complete range of specimen holders
SE and BSE imaging
Specifications:
Resolution: 1.5 nm
HT: 500V~30kV
Resolution: 1.5nm
Vacuum: High Vacuum
Magnification: 36x~800kx
Tilt: -15° to +75°
Rotation: 0º to 360º.
PHILIPS / FEI Sirion is a high-resolution scanning electron microscope (SEM). This versatile instrument is designed to provide researchers with detailed images and precision analysis on biological specimens, metals, polymers, and other materials at the nanometer scale. FEI Sirion is capable of producing images and data with up to 15 times the precision of a light microscope, making it a valuable tool for any research lab. This sem is equipped with a high-resolution Galileo III electron optical column which is capable of scanning up to 15 nm sample sizes. The column is designed for optimal efficiency while still providing a high degree of freedom in terms of focus, beam position, and excitation energies. The instrument runs on a self-correcting software package which allows for a wide range of imaging settings to produce high-resolution 3D images of specimens. PHILIPS Sirion has a 6-axis piezo stage which can be used to adjust the sample during imaging. This allows for fine-tuning of image control to achieve the highest resolution results. The instrument also features a motorized tilt-insert for high-precision stage positioning, and a large specimen chamber that is capable of holding a wide range of sample sizes. Additionally, the instrument is equipped with an optional calorimeter equipment that allows the user to measure specimen temperature during imaging. Sirion also features an advanced high-speed low-dose imaging system which is designed to capture images without causing damage to delicate samples. The unit includes an automated feeder machine which is capable of automatically adjusting imaging parameters to adapt to different sample conditions. The instrument also has a range of in situ techniques for further analysis, including EBSD, EDX, and PED. This versatile scanning electron microscope is one of the most powerful instruments currently on the market. It provides high-precision images and data, allowing researchers to accurately analyze their specimens at the nanometer scale. With its wide range of features and capabilities, PHILIPS / FEI Sirion is the perfect choice for any research laboratory.
There are no reviews yet