Used PHILIPS / FEI Sirion #9236011 for sale

PHILIPS / FEI Sirion is an advanced scanning electron microscope (SEM) designed for high-end research and imaging applications. It provides a range of advanced features for detailed three-dimensional imaging and characterization of micro- and nanoscale objects. FEI Sirion combines all of the features of cutting-edge SEM with a robust design for ultimate performance and stability. PHILIPS Sirion is capable of ultra-resolution imaging and analysis and enables detailed characterization of micro and nanoscale structures. It offers a wide range of imaging modes, such as top-down, tilt, centerline, angled, and backscatter imaging. It can be equipped with a wide variety of detectors, including high-sensitivity energy-dispersive X-ray spectroscopy (EDX), secondary electron (SE), and backscattered electron (BSE) detectors. Sirion has a novel digital signal processing system for high-power, high-resolution image acquisition. It is also equipped with a variable-pressure gas injection system to reduce contamination during imaging and provide a low-vacuum environment to minimize sample damage. PHILIPS / FEI Sirion also features a patented, user-friendly touchscreen control system for convenient operation. FEI Sirion offers a range of automated sample stage features to facilitate sample loading and alignment. It is further equipped with a "metrological" sample stage with a motorized z-axis for ultra-precise sample positioning. The stage is also equipped with three manual x-y axis for full sample manipulation and alignment. PHILIPS Sirion also has an advanced analysis suite which enables a detailed analysis of elemental composition, such as chemical and physical properties. It includes a library of pre-screened crystallographic phase maps as well as an integrated analytical suite for Fourier transform-based image processing. Overall, Sirion is an advanced, high-performance SEM ideal for a diverse range of research and imaging applications. It offers the latest in design and engineering, with industry-leading performance and stability. Its robust design makes it an invaluable tool for detailed imaging and analysis of objects on the micro- and nanoscale.