Used PHILIPS / FEI Tecnai 20 S-Twin #293639792 for sale

PHILIPS / FEI Tecnai 20 S-Twin is a scanning electron microscope that provides high-resolution imaging capabilities suitable for research and industrial applications. FEI Tecnai 20 S-Twin is a dual-beam instrument allowing users to perform both imaging and analysis on the same samples, with the scanning beam capable of producing high-resolution images and the analysis beam optimized for analysis techniques such as electron backscatter diffraction (EBSD). With PHILIPS Tecnai 20 S-Twin, users can take advantage of a variety of imaging modes, including high resolution and low vacuum (<4x10-3 Pa). Tecnai 20 S-Twin has a variety of adjustable parameters allowing high-resolution imaging of samples. These include a pixel sampling rate of 1nm and a maximum working magnification of up to 400kX. In addition, multiple filters can be applied, including spectral, phase and broadband. Furthermore, PHILIPS / FEI Tecnai 20 S-Twin is equipped with a number of beam control features, such as deflection control, position control and deflection stabaliser. This equipment also allows the user to generate three-dimensional images using electron tomography. For specimen manipulation, FEI Tecnai 20 S-Twin features a 6-axis motorized sample feed system as well as a tilt and declination control. Additionally, features such as automatic position tagging and interactive visualization of the sample are available. PHILIPS Tecnai 20 S-Twin is also equipped with advanced AI analysis algorithms for the analysis of the results. Aside from its imaging capabilities, Tecnai 20 S-Twin also has a variety of sample preparation options. This includes multiple sample holders and an automated sample selection and loading to reduce potential specimen damage. In addition, a range of specimen preparation techniques, such as critical point drying, chemical cleaning, or ion milling, are also available. Overall, PHILIPS / FEI Tecnai 20 S-Twin is a powerful scanning electron microscope suitable for a range of research and industrial applications. With its adjustable parameters and sample manipulation features, this instrument enables detailed imaging and analysis of a variety of materials with high levels of accuracy.