Used PHILIPS / FEI Tecnai 20 S-Twin #293812127 for sale

PHILIPS / FEI Tecnai 20 S-Twin is a scanning electron microscope (SEM) with the unique ability to provide imaging capabilities at both the sub-nanometer and the macro-level. This microscope is equipped with both an in-lens thermal gravity objective and a high-resolution environmental scanning electron detector. The in-lens thermal gravity objective provides excellent resolution in the near to mid-range field of view while the environmental scanning electron detector enables the observation of nano-structures and surface morphology. This cutting-edge technology allows users to observe a wealth of morphological features within both biological and inorganic subject matter. The SEM offers a range of specimen investigation capabilities which include bright- and dark-field imaging, variable pressure mode, cathodoluminescence, and backscattered electron detectors. It also has an automated dual tilt access feature which allows users to dynamically correct misalignments in the viewingplane. This advanced feature is especially useful when imaging curved or irregular materials. FEI Tecnai 20 S-Twin is compatible with double-sided chucks and the latest sample holders, such as substrates and dummies. This flexibility allows you to perform a wide variety of examination techniques with diverse sample types. PHILIPS Tecnai 20 S-Twin also has powerful software features, such as image analysis and automatic pattern recognition. Its advanced image-processing tools, and the ability to store and track image data, allows you to manipulate and analyze imaging information quickly. Its software is also adept at configuring the microscope's parameters, allowing you to maximize its imaging capabilities. Tecnai 20 S-Twin is an ideal tool for microscopic research requiring both high-resolution images and a range of analytical tools. Its superior performance and flexibility make it suitable for a variety of applications including surface metrology, nano-fabrication, and semiconductor defect analysis. This state-of-the-art microscope is able to provide users with the high-quality imaging capabilities they need to achieve reliable results quickly and accurately.