Used PHILIPS / FEI Tecnai F20 #9304082 for sale

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PHILIPS / FEI Tecnai F20
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ID: 9304082
Transmission Electron Microscope (TEM) Gun Mounted FEG filament FEG Accelerator Outer vessel: 300 kV Compustage TEM Rack STEM Rack HT Tank_200 kV HT Cable Water rack Hand panel L, USB Hand panel R, USB TMP Controller ODP System Dual monitor EDWARDS RV3 Vacuum pump Detector: BF/DF Stem detector GIF 200 EDAX PC Operating system: Windows 2000 Remote controller Detector (Vacuum leak) Personal Computer (PC): Super micro TEM PC EDS Card (5) Ports LAN Card Dual monitor card Keyboard Mouse Utilities: Main chiller Air compressor Missing parts: Holders Service tool box Bake out tool.
PHILIPS / FEI Tecnai F20 is an advanced scanning electron microscope (SEM) designed for industrial and academic use. It provides a high level of performance and versatility, enabling the imaging of surface features, particles and samples at the nanometer scale. The F20 is also equipped with a wide array of analytical capabilities, including elemental microanalysis, backscattering analysis and X-ray spectroscopy, making it an ideal tool for microelectronics, semiconductor device fabrication, materials science research, microstructural analysis and drug discovery. The F20 features an environmental chamber, which is capable of featuring up to 10-7 torr and temperatures from -50°C to +150°C, enabling it to handle a wide range of sample types and conditions, such as reactive samples, explosives and cryogenic samples. Its EDX detector permits fast X-ray spectroscopy with up to 128K channels and a motorized stage makes navigation in three dimensions possible. The F20 is equipped with a 200kV field emission electron gun with a very high level of stability, providing a range of current from 10 pA to 500A and a superior signal to noise ratio. It also features an in depth automated scanning electron microscope that is capable of a wide variety of sample runs. This includes optical lithography and wafer analysis, profile measurement and visualization, automated tilt and flip and high resolution imaging. In addition to imaging capabilities, the F20 also offers a range of analytical options. With a combined EDX and WDX equipment, the system is capable of conducting mineralogical, elemental, solid-state and bio-molecular analysis. With an Ever erected vacuum transfer unit, the machine is also capable of introducing samples into a vacuum environment. Overall, FEI Tecnai F20 is an advanced imaging and analysis tool, delivering robust performance and multiple analytical capabilities. It can provide a comprehensive solution for a variety of applications in industrial and research settings, including microelectronics, semiconductor device fabrication, materials science research, microstructural analysis and drug discovery.
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