Used PHILIPS / FEI Tecnai F20 #9375418 for sale

PHILIPS / FEI Tecnai F20 Scanning Electron Microscope (SEM) is a high-end scientific instrument that enables researchers to obtain high-resolution images of samples in a variety of environments. The F20 is equipped with an advanced 5-axis tracking equipment that enables precise and accurate sample movement, allowing for high-resolution imaging capabilities. In addition, the instrument is equipped with a high-performance Gatan SFEG detector, which provides excellent contrast and resolution over a wide range of magnifications. The F20 is designed with a versatile, double-tilt, 10-position sample stage to allow for the greatest flexibility in imaging samples. The sample stage is designed to support samples up to 100 mm in diameter and 3 kg in weight. The 5-axis tracking system ensures that the sample stage is completely aligned with the sample for precise and accurate imaging. The F20 can be operated at a maximum anode voltage of 20 kV, providing excellent contrast and resolution. The F20 is equipped with a field-emission gun (FEG) electron source, which provides an increased resolution and greater stability. The electron source enables the production of near-atomic level images, while a range of detector options allow researchers to choose between bright field, dark field, and imaging of materials at different thicknesses and chemical compositions. The F20 also offers a range of digital imaging capabilities, including monochrome imaging, optical zoom and color imaging. The unit also supports a range of imaging techniques, such as back-scattered electron imaging and energy-filtered imaging, which can help researchers to gain insight into intricate structures. To ensure easy and safe operation, the F20 features a soundproofing hood and lifting table, as well as a range of safety features such as an automated safety switch and gas handling safety exhaust. Additionally, the machine is equipped with a convenient control panel that allows for quick and efficient operation. FEI Tecnai F20 Scanning Electron Microscope is an advanced, high-end instrument designed to provide researchers with high-resolution images of materials at near-atomic resolution. With its versatile design, wide range of imaging capabilities, and safety features, the F20 is an ideal instrument for a variety of research applications.