Used PHILIPS / FEI Tecnai F30 #293607314 for sale

PHILIPS / FEI Tecnai F30 is a scanning electron microscope (SEM) that uses a field emission gun (FEG) to generate a high-resolution and high-quality electron beam. This sophisticated instrument is capable of imaging a wide range of samples, including biological samples such as cells, proteins, and metals of various thicknesses and compositions. Specialized imaging modes such as backscattered electron imaging and energy dispersive X-ray spectroscopy (EDS) can also be employed to reveal key structural details. FEI F30 utilizes a thermionic FEG electron source to produce a high-resolution electron beam. The design of this FEG gun takes advantage of the fact that electrons are emitted from the sharp tips of filamentary cathodes when a voltage is applied. The resulting electron beam has a very low current and a small spot size for high-resolution imaging. This electron source can be operated at an accelerating voltage of up to 30 kV, with a resolution of 2.0 nm at a working distance of 10 mm. PHILIPS TECNAI F 30 also features an environmental sample chamber that can be used with a built-in stage cooling system to keep samples at optimal temperatures during imaging. This system is suitable for imaging biological samples such as cells and proteins without any additional vacuum system. The sample chamber is also equipped with an automated XYZ axis that allows for scanning over large areas, as well as a varied range of lenses to accommodate different levels of magnification. FEI TECNAI F 30 offers a range of imaging modes that can be employed to gain essential information about samples. Backscattered electron imaging (BSE) can be used to acquire atomic-scale images of surface structure, while energy dispersive X-ray spectroscopy (EDS) can provide a detailed analysis of a sample's chemical composition. This instrument also offers a range of automated ultra-high vacuum processing options, including sputter coating and e-beam lithography. Taken together, the features of FEI Tecnai F30 provide a robust and versatile SEM solution for acquiring high-resolution imaging to study a range of samples. This scanning electron microscope can be employed for a variety of applications, including cell imaging for medical research, materials science studies, semiconductor device fabrication, and failure analysis.