Used PHILIPS / FEI Tecnai F30 #9195579 for sale

PHILIPS / FEI Tecnai F30 scanning electron microscope is a powerful microanalysis tool for researchers in a variety of disciplines. This microscope features an advanced electron optical system which combines a number of innovations to provide the highest performance in imaging and characterization. At the heart of the system is a field emission electron gun which produces a low-energy, highly focused beam. This enables the highest achievable lateral resolution, exceptional depth of field, and excellent line-pair contrast. The column design strives to minimize both chromatic and spherical aberration, with a large depth of focus and superior Contrast Transfer Function (CTF). In addition, the microscope features an advanced InLens detector. This detector captures electrons without the need for refocusing and provides an added level of sensitivity and accuracy. This makes it an ideal choice for both high magnification imaging and analysis of large areas. FEI F30 is also equipped with a newly designed semiconductor detector which allows for highly versatile imaging. This detector is capable of capturing low-energy electrons while still maintaining the ability to distinguish different elements within a sample. It is a great choice for analyzing thin films, because of its high-speed imaging capabilities. In addition, the microscope can be used with a variety of detectors, such as x-ray detectors, electron-backscatter detectors, and high-angle annular dark-field detectors, to further extend its capabilities. These techniques are helpful for various tasks such as high-resolution elemental analysis and surfacing reconstructions. PHILIPS TECNAI F 30 also features a high acceleration voltage and a long working distance. This combination makes the microscope an excellent choice for imaging with a higher depth of field, allowing for greater clarity from the sample. F30 is thus an excellent choice for a variety of analytical and imaging applications.