Used PHILIPS / FEI Tecnai F30 #9224715 for sale

PHILIPS / FEI Tecnai F30 is a scanning electron microscope (SEM) designed to produce high-resolution images of samples with a maximum magnification of up to 400,000x and a resolution of 1.0 nanometers. Equipped with a vacuum system, it is capable of imaging the sample within seconds and is suitable for imaging both static and dynamic processes. FEI F30 features a field emission electron gun that produces high brightness, low divergence electron beams for optimal imaging. PHILIPS TECNAI F 30 offers three scanning magnifications, standard, low and very high, to provide excellent contrast and resolution levels for a variety of samples. The full field of view ranges from 0.6 mm up to 20 mm, allowing imaging of large sample areas quickly and accurately. A unique range of scan speeds is available to produce high-resolution images without sacrificing datapoints accuracy. PHILIPS / FEI F30 uses an automated imaging workflow allowing for efficient sample preparation and observation. For imaging of nanomaterials, Tecnai F30 supports several automated alignment and navigation capabilities including 360° Advanced Helical Scanning. An external stage travel range of 70mm height and 200mm width is available for easy navigation of the sample. PHILIPS Tecnai F30 has several imaging modes available, including backscattering-electron, secondary-electron, reflected-electron and panchromatic imaging. It is also capable of measuring topographic and elemental surface mapping with the integrated EDX system. With its generous sample chamber, PHILIPS F30 can accommodate samples of up to 175mm in diameter and up to 80mm in height. FEI TECNAI F 30 is packed with advanced imaging features, allowing users to customize their images and to add annotation. Automated backscattered electron imaging can be used to produce 3D images and Photostitch imaging offers the ability to create panoramic images. PHILIPS / FEI TECNAI F 30 also supports analysis tools such as image comparison and particle analysis to quickly identify any potential defects in the sample. FEI Tecnai F30 offers maximum performance with flexibility and scalability to meet the needs of different imaging tasks. The robust nature of TECNAI F 30 ensures reliable operation, and with features like automated remote access and intuitive user interface, it makes for a reliable system for high-resolution imaging.