Used PHILIPS / FEI Tecnai F30 #9277568 for sale

The PhillipsPHILIPS / FEI Tecnai F30 scanning electron microscope (SEM) is a unique and powerful instrument for material analysis. It is engineered to provide superb surface topography images, high-resolution elementary compositional analysis, and fast and reliable sample scanning. This versatile microscope provides sub-nanometer resolution images that can be observed in real time using variable pressure or variable angle imaging. It is equipped with a cold field-emission gun, which allows for minimal electron leakage and low sample contamination. This is ideal for use with hard and high aspect ratio samples. The system also comes with a 'Smart Mobility' sample handling solution that enables quick and efficient sample exchange. Sample preparation and image acquisition is highly efficient and can provide users with accurate images in minutes. FEI F30 is equipped with advanced digital and analog electronics and sophisticated software to optimise your imaging capabilities. The versatile software packages allow for detecting, adapting and tracking beam settings for various imaging parameters. As well as, various modes available for; multishot and progressive scan, high-magnification imaging, scanning materials, free-moving electrons operation and sample tilt angle analysis. PHILIPS TECNAI F 30 features the unique 'EasyTEM' mode, which simplifies the basics of operation by providing operators with the ability to simply choose pre-defined imaging conditions depending on the type of sample data needed. FEI TECNAI F 30 combine's reliable performance and user-friendly controls, making it the ideal choice for a wide range of scientific applications. This microscope is an invaluable tool for materials science, as it gives detailed information regarding the physical and chemical properties of sample materials. Its reliable and flexible design makes it an attractive option for students, researchers and practitioners in the field.