Used PHILIPS / FEI Tecnai G2 F20 UT D214 #293607886 for sale

PHILIPS / FEI Tecnai G2 F20 UT D214 is a dual beam scanning electron microscope (SEM) designed for advanced imaging and characterization applications. This versatile microscope was designed to provide unparalleled visual resolution and analytical capabilities within the academic, industrial, and materials research industries. FEI Tecnai G2 F20 UT D214 utilizes an impressive collection of imaging and analytical technology, including a large field of view and integrated FIB/ESEM capabilities. The advanced scanning capabilities of this microscope are made possible by the high-resolution Schottky emitter and cryogenically cooled high throughput electron source. This helps to provide high-resolution imaging of sample topography within a large field of view. Magnification can range from 5x up to 2,000,000x, allowing for a variety of microscopic imaging tasks. Additionally, advanced imaging features such as variable pressure imaging, variable pressure tomography, 3D X-ray images, and large sample chamber handling are readily available. The integrated FIB/ESEM capabilities of PHILIPS Tecnai G2 F20 UT D214 are essential for or materials testing. Its DualBeam™ technology allows for imaging of samples at a high resolution and for interactive removal of material for nano-scale analysis. The microscope's DLAN electron beam lithography also allows for direct write of material patterns and structures on surfaces, giving researchers a more robust control of the characterizations. Tecnai G2 F20 UT D214 also offers enhanced analytical capabilities, including advanced energy and wavelength dispersive spectroscopy (EDS/WDS). This allows users to conduct elemental analysis and identify phases of samples. Elements can be identified with high accuracy and in different concentrations. Furthermore, the satellite detectors on the instrument adds an unparalleled level of precision and an increased speed for both EDS and WDS. Overall, PHILIPS / FEI Tecnai G2 F20 UT D214 is an unmatched scanning electron microscope, used to accomplish a myriad of imaging and analytical tasks. Its integrated DualBeam™ and FIB/ESEM capabilities allow for advanced topography imaging, while its energy/wavelength dispersive spectroscopy allows for elemental analysis and identification. With its high-resolution scanning capabilities and robust analytical functions, FEI Tecnai G2 F20 UT D214 is a versatile choice for a variety of research applications.