Used PHILIPS / FEI Tecnai G2 F20 #293621526 for sale

PHILIPS / FEI Tecnai G2 F20 Scanning Electron Microscope (SEM) is an advanced instrument that allows researchers to observe materials with extraordinary magnification and detail. This is done by bombarding a sample with a beam of electrons instead of light, creating a three-dimensional image of the surface. FEI Tecnai G2 F20 uses a field emitter as its electron source, which allows for more precise control of the electron beam's energy and size. This advanced technology enables researchers to focus on the finest details of their samples, thanks to a beam spot size of down to 5 nanometers. PHILIPS Tecnai G2 F20 also offers a wide range of resolutions, ranging from basic imaging to high-resolution imaging in both plan and tilt modes. This allows users to get detailed images of their sample, from the surface all the way down to the atomic level. Tecnai G2 F20 features an interactive control platform where users can select a variety of settings to customize each imaging session. These settings include a variety of detector settings, magnification levels, beam current, and even image processing settings to improve image quality. For those researchers who are looking to produce even higher resolutions, PHILIPS / FEI Tecnai G2 F20 offers a number of additional features. It includes an advanced auto alignment system that can make fast corrections to the sample to minimize any drift while imaging, and a cryo stage that allows for ultra-low temperature imaging. In short, FEI Tecnai G2 F20 Scanning Electron Microscope is a cutting-edge instrument that provides researchers with the powerful capabilities they need to observe materials with incredible detail and precision. Thanks to its field emitter, interactive control platform, and range of other advanced features, the G2 F20 allows researchers to make groundbreaking observations at the atomic level.