Used PHILIPS / FEI Tecnai G2 F20 #293802955 for sale

PHILIPS / FEI Tecnai G2 F20
ID: 293802955
Transmission Electron Microscope (TEM) Scanning Transmission Electron Microscope (STEM) LaB6 Filament Acceleration voltage: 200 kV GATAN Energy filter Electron Energy Loss Spectrometer (EELS) Tomography Energy Dispersion Spectrometer (EDS) Spatial resolution: 10-5 mm³ CCD Camera Object holders: Sample holder Cryo-holder (Liquid nitrogen temperature) Single-tilt heating holder (1500°C) Double-tilt heating holder (1100°C) Simple tilt holder Double tilt holder.
PHILIPS / FEI Tecnai G2 F20 is a high-performance, versatile scanning electron microscope (SEM) designed to meet the demanding requirements of advanced research and industrial applications. This state-of-the-art instrument offers exceptional imaging capabilities, analytical features, and user-friendly operation, making it ideal for a wide range of nanotechnology, material science, life science, and semiconductor research. At the heart of FEI Tecnai G2 F20 is a field emission gun (FEG) electron source, which provides high brightness and stability for superior imaging resolution and analytical performance. The FEG produces a finely focused electron beam with a small probe size, enabling high-resolution imaging of samples at the nanoscale level. This makes PHILIPS Tecnai G2 F20 well-suited for imaging a variety of materials, including biological specimens, nanomaterials, polymers, and semiconductors. Tecnai G2 F20 features a high-performance transmission electron microscopy (TEM) mode, allowing users to perform both SEM and TEM imaging on the same platform. This dual functionality provides researchers with a comprehensive set of imaging capabilities for studying the microstructure and composition of samples with unparalleled detail. The instrument is also equipped with an energy-dispersive X-ray spectroscopy (EDS) detector for elemental analysis, enabling users to identify and quantify the chemical composition of materials with high sensitivity and spatial resolution. In addition to imaging and analysis capabilities, PHILIPS / FEI Tecnai G2 F20 offers advanced techniques for sample manipulation and characterization. The instrument is equipped with a motorized stage that allows for precise sample positioning and navigation, enabling users to easily locate and analyze specific regions of interest on the sample. FEI Tecnai G2 F20 also features in situ heating and cooling stages, as well as gas injection systems, for studying sample behavior under controlled environmental conditions. User-friendly software interface and intuitive controls make operating PHILIPS Tecnai G2 F20 straightforward and efficient. The instrument is equipped with a range of automated imaging and analysis functions, such as automated focus, astigmatism correction, and beam tilt adjustment, to streamline data acquisition and enhance productivity. Tecnai G2 F20 software also includes advanced image processing and analytical tools for image visualization, data interpretation, and report generation. Overall, PHILIPS / FEI Tecnai G2 F20 is a cutting-edge scanning electron microscope that offers exceptional imaging resolution, analytical performance, and operational flexibility for a variety of research applications. Its advanced capabilities, user-friendly interface, and versatile functionality make it a powerful tool for addressing complex scientific questions and advancing our understanding of the nanoscale world.
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