Used PHILIPS / FEI Tecnai G2 F30 Twin #293604851 for sale
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ID: 293604851
Transmission Electron Microscope (TEM)
STEM System for FEG
Scanned imaging technique
FISCHIONE INSTRUMENTS 3000 HAADF Detector: 300 kV
Upgraded BRUKER Quantax EDS 400 Silicon drift detector
Detector: 30 mm Window
PC
EDX Spectroscopy technique
Low-dose exposure technique and performance test
Xplore3D (Tomography except STEM tomo)
GATAN UltraScan 4000 UHS Pre-Gif CCD
With U-type coating for ultrasensitivity
Power: 300 kV
GATAN Quantum GIF 963 Energy filter
With CCD: 2000 x 2000
Energy filter embedding
EFTEM EELS Module
CCD Camera embedding
Accessory cabinet 33U, 19''
TEM Scripting
Free lens control
TEM Auto-adjust
TEM Auto-gun
LCD Monitor, 20"
Anti-contaminator
Nitrogen cooled with Be blades for TEM
JUN-AIR Compressor: 115 V, 50/60 Hz
GE Digital energy LP Uninterruptible Power Supply (UPS).
PHILIPS / FEI Tecnai G2 F30 Twin is a state of the art scanning electron microscope (SEM) that combines extreme imaging resolution with a variety of options to streamline SEM usage. In order to achieve maximum imaging resolution, FEI Tecnai G2 F30 Twin is equipped with an in-lens and in-column backscattered electron (BSE) detector, an Everhart-Thornley point detector, a quadruple secondary electron (SE) detector, a medium energy backscatter (MEB) detector, and a top-dwell detector that displays an image faster than conventional positioning methods. PHILIPS Tecnai G2 F30 Twin also features a multi-purpose sample holder capable of carrying up to 8 samples, a non-magnetic pipette, a PixelPro sample orientation system that automatically detects sample parameters, a double-tilt holder, and a range of accessories to enable flexibility of use. Moreover, the ever-versatile cryo-transfer technique is also possible with this SEM. Tecnai G2 F30 Twin also comes with integrated automated image analysis software. This software can be used to analyze complex SEM images, and features image math, image operations, manual and automated grain counting, as well as pattern recognition algorithms. Furthermore, PHILIPS / FEI Tecnai G2 F30 Twin is equipped with an adjustable source generator that enables the user to adjust and monitor beam parameters, such as acceleration voltage and current. This adjustable source generator also features innovative control algorithms, allowing the user to easily adjust sub-millisecond temporal exposure in order to capture transient events that would normally be too fast to discern. FEI Tecnai G2 F30 Twin is truly one of the most powerful SEMs on the market today. With its highly advanced technology and integrated automation solutions, the G2 F30 Twin provides incredible imaging quality, particle analysis capabilities, flexibility of use, and automated image analysis software. It is the perfect tool for any laboratory looking for a reliable and intuitive SEM solution.
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