Used PHILIPS / FEI Tecnai G2 F30 Twin #9376693 for sale

PHILIPS / FEI Tecnai G2 F30 Twin is a high-performance field emission scanning electron microscope (FE-SEM) used for nanoscale imaging applications in research and industry. It has an advanced field emission source that enables high throughput and short cycle times for users, making it one of the most powerful instruments in its class. The G2 F30 has a high resolution of 0.7nm and a working distance of 30.0 millimeters, providing magnification from 5x to 300000x. It offers both high and low vacuum modes for a range of applications including imaging, particle size analysis, and composition analysis. The microscopes use a large number of detectors to capture a wide range of features from different regions of interest. Its progressive scan technology enables the acquisition of high-resolution images with a low-cost, digital video camera. The system is equipped with a variety of automated image-processing capabilities, such as MEBES layer production, digital analysis, and image stitching. The G2 F30 has a fully integrated tilt/rotation stage that allows for precise positioning of samples at any angle of inclination or rotation. The instrument includes an automated software package for the preparation and presentation of data, as well as a range of hardware features that can be customized to the user's specific requirements. The G2 F30 offers high levels of extended usability, with an intuitive user interface that simplifies operation and automatic sample recognition. Its range of scanning and imaging modes provide users with superior imaging quality and control. This microscope also offers advanced systems for beam energy control, and innovative software packages enabling complete control over the sample preparation process. This makes the G2 F30 a powerful tool for nanoscale imaging and research.