Used PHILIPS / FEI Tecnai G2 F30 #293778924 for sale

PHILIPS / FEI Tecnai F30 is a scanning electron microscope (SEM) designed to provide unrivalled performance and versatility in a highly reliable, user-friendly instrument. It is suitable for a wide variety of scientific and industrial applications and integrates state-of-the-art technologies. FEI F30 utilizes a 20kV, high-resolution LaB6 field emission gun (FEG) source to generate its high-resolution, low-contrast images. The energy dispersive X-ray (EDX) microanalysis capabilities allow for rapid and accurate elemental characterization of the sample. PHILIPS TECNAI F 30 is equipped with an industry-standard Gemini II electron column and an ultra-low-vacuum (ULV) system for sample changing. It also features a smaller 30µm gun positioner that enables a new level of accuracy in probing features as small as 30µm. PHILIPS Tecnai F30's advanced software suite includes built-in automation tools for rapid image acquisition, advanced image processing and data analysis. This enhances the capabilities of FEI TECNAI F 30 for advanced materials investigation. For sample observation, Tecnai F30 employs a large, 18" Elmuirview monochrome display. This monitor provides excellent image clarity and contrast, and is capable of displaying magnifications up to 1,000,000x. TECNAI F 30 is one of the few SEMs to feature a 10nm accuracy EDX/X-ray microanalysis system. This system is extremely effective in detecting and identifying chemical structures on the sample requiring minimal beam time and energy. PHILIPS F30 SEM is an ideal choice for users seeking a powerful, high-performance instrument with exceptional versatility. Its high-resolution images and wide range of features make it a valuable tool for researchers and industries alike. Its sophisticated automation and easy to use software provide substantial savings in time and cost by reducing sample processing time and increasing efficiency.