Used PHILIPS / FEI Tecnai G2 Spirit Twin #293594964 for sale

PHILIPS / FEI Tecnai G2 Spirit Twin is a dual-beam scanning electron microscope that combines advanced performance features and sophisticated analytics. This equipment combines high-precision technology, scanning capabilities up to 14 nm and excellent image stability with an intuitive user interface. It is an ideal choice for lab and research applications. FEI Tecnai G2 Spirit Twin features two separate electron columns, each with its own dedicated energy filtering system and optics. This allows for simultaneous imaging and analysis of different sample types, such as conductive and insulating materials. The image quality produced is consistent, enabling high-resolution imaging and analysis. The G2 Spirit Twin also includes an automated, motorized stage and sample holder. This allows for fast and accurate navigation of the sample and enables the user to acquire multiple images at varying magnifications without having to adjust the sample manually. The scanning electron microscope also supports a wide range of electron detectors, such as secondary and backscattering detectors, imaging filter, back thinned CCD (charge-coupled device) detectors and on-axis EDS (energy-dispersive X-ray spectroscopy) detector systems. This enables comprehensive analysis of highly complex sample types. The G2 Spirit Twin also features field emission gun (FEG) options for either cold field emission or high-brightness operation. The instrument supports the use of dual cold cross-field emitters for low-noise operation and high-resolution imaging. Finally, the unit includes a variety of automated software tools, such as an advanced beam blanker machine that minimizes potential sample damage and control of vacuum level, beam tilt, brightness and astigmatism. Together, these features make the G2 Spirit Twin an ideal choice for the most complex research and exploration projects.