Used PHILIPS / FEI Tecnai G2 Spirit Twin #293600943 for sale

PHILIPS / FEI Tecnai G2 Spirit Twin scanning electron microscope ( SEM ) is an advanced imaging equipment designed to obtain detailed microstructural analysis. It offers high resolution and contrast imaging along with automatic image acquisition and image processing capabilities. This system is ideal for a wide range of applications, such as semiconductor failure analysis, nanostructure analysis, materials science research, and materials engineering. FEI Tecnai G2 Spirit Twin features a ultra-high vacuum chamber equipped with a field emission gun (FEG). This unit produces a highly controlled and reliable electron beam that is capable of obtaining images with a resolution of up to 1 nanometer. The FEG electron beam allows for very high current densities and magnifications up to 500,000x. The SEM is capable of imaging specimens in secondary and backscattered electron (BSE) modes along with high resolution Topografiner or 3D tomography imaging. The automatic image acquisition systems allow for quick and accurate imaging of any type of specimen. The Image Explorer controls and automation software allows for the user to easily navigate through multiple images simultaneously, along with providing powerful automated analysis methods. PHILIPS Tecnai G2 Spirit Twin has a sample stage with a large sample area and a tilt range of +/- 70° which allows for imaging with any orientation. This machine has a fully automated SEM preparation station that can be used for sample conditioning. Tecnai G2 Spirit Twin tool features advanced digital imaging capabilities that include contrast and intensity controls, which can measure both brightness and color of the scanning images. The fast processing speed of the asset guarantees a high frame rate and interactive capabilities with minimal delay. Advanced interactive imaging analysis tools include EDS/EDX, 3D-XKR and 3D-XRA. Overall, PHILIPS / FEI Tecnai G2 Spirit Twin is a powerful, versatile and easy to use scanning electron microscope designed to facilitate microstructural analysis. With high resolution imaging, fast image acquisition speed and an array of image analysis tools, this model is well-suited for a wide range of applications.