Used PHILIPS / FEI Tecnai G2 TF20 #9361086 for sale
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ID: 9361086
Vintage: 2004
Transmission Electron Microscope (TEM)
With STEM mode
Voltage range: 40 to 200 kV
Bright field / Dark field
Secondary electron detector for STEM mode
Energy Dispersive Spectroscopy (EDS) detector
Chiller
FEG Microscope
Field emitter gun
Camera: CCD Orius
SC 1000 CCD
With A860 GIF 2000
Electron Energy Loss Spectroscopy (EELS)
Energy Filtered TEM (EFTEM)
Nanometer Pattern Generating System (NPGS)
FEG Replaced
Point resolution: 0.27 nm
Line resolution: 0.144 nm
STEM Resolution: 1.0 nm
Information limit: 0.18 nm
Energy spread: 0.7 eV
Maximum alpha-tilt angle with double-tilt holder: ±50°
Maximum diffraction angle: ±10°
Camera length: 35-2300 mm
EDS Solid angle: 0.13 srad
Standalone PC
Operating system: Windows XP
Voltage range: 80 to 300 kV
Power supply: 200kV
2004 vintage.
PHILIPS / FEI Tecnai G2 TF20 is a high-performance, field emission scanning electron microscope (FESEM). It is designed for applications in material science, live cell imaging, and nano-scale imaging. This equipment features a unique combination of superior resolution and superior aberration correction compared to other FESEMs. The advanced Auto-Tune function keeps the optimal beam conditions and ensures consistent performance for the length of the work session. The G2 TF20 is outfitted with a high-resolution field emission gun (FEG) source, which provides superior acceleration voltage stability and excellent high resolution imaging performance. This system has X-ray detector capabilities for microanalysis of materials, and is also capable of in-situ imaging of biological samples. The G2 TF20 features a unique fully integrated unit designed for high precision sample observations. The Tilting-Magnification Multi-Dimensional Structured illumination (TM-MDIS) machine provides an advanced imaging solution for improved sample characterization and observation. It offers a unique combination of 3D-White LightTM, Digital KöhlerTM, and Multi-Dimensional Structured Illumination to provide an unprecedented level of 3D information. The G2 TF20 is equipped with a 30 nm resolution detector tool, enabling observation of the smallest features of a sample in detail. The asset also provides advanced imaging techniques such as SE-BF, SE-DF, SE-APRT, SE-LF, and SE-BSE to gain 3D information about your sample. In addition, the G2 TF20 also provides automated pattern recognition and feature analysis capabilities to efficiently characterize and quantify surface features and microstructure components. This model offers powerful automation and ease of use to drastically reduce user-time and increase lab productivity. The G2 TF20 is the ultimate scanning electron microscope for researchers and engineers who need high resolution imaging and a wide range of innovative analytical tools for the characterization of their sample.
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