Used PHILIPS / FEI Tecnai G2 #293792271 for sale

PHILIPS / FEI Tecnai G2 is a state-of-the-art scanning electron microscope (SEM) designed for both routine and advanced material characterization. It has a field emission electron gun (FEG) which provides extremely high beam currents in the range of 1 to 140 pA, allowing for higher resolution imaging and faster acquisition times. The G2 includes a large chamber for viewing and manipulating samples. The three-axis stages can position the sample through a range of movements with motor speeds up to 15 mm/s, and a sample chamber tilt of ±60°. An air-bearing spindle allows for high-accuracy rotation and tilt of the sample. The G2 utilizes a monochrome charged-couple device (CCD) camera for imaging. The standard camera has an effective resolution up to 2560x1920 pixels, allowing for detailed views of the sample's surface. The Accelx secondary electron (SE) angular detector (AD) and backscatter electron (BE) detector (BD) are also available for imaging in high-contrast and monochrome mode, respectively. The G2 is equipped with a Schottky field emission source (FES) for current modulation. This allows for high-resolution imaging as well as analytical capabilities. With the FES, users can observe the specimen's microstructure on a nanometer-level with greater accuracy than with traditional SEMs. The current can be finely tuned, allowing for accurate SEM imaging as well as energy-dispersive X-ray spectroscopy (EDS) for elemental and chemical analyses. FEI Tecnai G2 is a versatile instrument for both high-resolution imaging and accurate elemental quantification. With its high-power field emission source, high-resolution detectors, and large sampling chamber, it provides a comprehensive range of possibilities for any type of material characterization.