Used PHILIPS / FEI Tecnai G2 #9350685 for sale

PHILIPS / FEI Tecnai G2 is a scanning electron microscope used in a wide variety of applications, including materials science, medical device production, and semiconductor fabrication. The fundamental technology of the microscope is that of the scanning electron beam which, when travelling over a sample, gives an image with high resolution and depth of field. FEI Tecnai G2 specifically is an adjustable-focus scanning transmission electron microscope (STEM), uniquely combining the features of both the TEM and SEM microscope in one instrument. PHILIPS Tecnai G2 is equipped with an advanced digital imaging equipment, optimized capture and processing algorithms, and has a spot size as small as 31.5 nm. This allows for imaging of even the smallest structures, with high contrast, resolution, detail and sharpness. Additionally, Tecnai G2 has an adjustable quadrupole field STEM Detector System with three-dimensional imaging which substantially increases contrast by suppressing the secondary electrons detected in the conventional SEM imaging mode. The adjustable field STEM unit also allows for single particle analysis and elemental maps. In addition to all these high-powered imaging features, PHILIPS / FEI Tecnai G2 is specially designed for materials characterization. It features the Energy Dispersive X-Ray (EDX) machine, which allows for elemental analysis of samples with superior sensitivity and resolution. Combined with high-definition EDS mapping, users have the ability to characterize structure/composition and microstructural features of samples with excellent accuracy. The microscope also features a cryo-ultramicrotomy stage for sample preparation and cryo-transfer of specimens, and a fast tilt technique for aberration-corrected imaging. In sum, FEI Tecnai G2 scanning electron microscope is an advanced, multi-functional instrument built to achieve high-resolution imaging and materials characterization of various samples. Its adjustable-focus STEM technology along with its EDX and EDS mapping capabilities provide users with the ability to inspect microstructural features in unparalleled detail.