Used PHILIPS / FEI Tecnai G2 #9399892 for sale

PHILIPS / FEI Tecnai G2 scanning electron microscope (SEM) is a powerful tool for imaging and analyzing samples at the nanoscale. Its wide range of features and functions make it ideal for a variety of applications. FEI Tecnai G2 features an advanced in-chamber environment that allows for operation of even the most delicate samples in a controlled atmosphere without the need for an external vacuum chamber. Its high-speed electron optics provide an image resolution of up to 1nm, and its state-of-the-art technology enables observation of minute sample details. The integrated Oxford Energy Dispersive X-ray (EDX) spectrometer further enhances the SEM's capability, allowing operators to perform elemental analysis of the sample. The EDS spectrometer is equipped with advanced digital imaging technology, providing high-contrast images that allow for precise elemental mapping. The variable pressure imaging option enables imaging of samples at greater magnifications than would be possible in a conventional high vacuum SEM. This feature is particularly useful for organic samples, as it allows them to be studied in-depth without damaging them. PHILIPS Tecnai G2 offers a variety of other features, including advanced manipulation mechanisms for picking up, moving, and positioning of samples; in-focus detection for maximum contrast; and glassy carbon coating for imaging samples on a low voltage beam. Tecnai G2 also includes unique software packages for imaging control, analysis, and report writing to enhance the imaging capabilities of this versatile SEM. Overall, PHILIPS / FEI Tecnai G2 scanning electron microscope is a powerful tool that provides imaging and analysis of samples at the nanoscale. Its advanced imaging and control capabilities, variable pressure imaging and software packages make it an ideal choice for a broad range of nanostructural characterization applications.