Used PHILIPS / FEI Tecnai T20 #293595306 for sale

PHILIPS / FEI Tecnai T20 Scanning Electron Microscope (SEM) is a powerful and reliable imaging equipment designed to capture intricate details and reveal the inner structures and composition of samples. Its advanced features, such as variable pressure detection, and specialized imaging modes make it an ideal choice for a wide range of industries. FEI Tecnai T20 SEM has a variety of imaging capabilities and settings to choose from. It uses an electron source that consists of an electron gun and electronic magnifier to generate a beam of electrons and magnify the image. The beam is then focused on the sample and the captured data is transmitted to a monitor for display. The SEM also provides an array of dedicated imaging capabilities such as energy-filtered imaging, variable pressure detection, backscattered electron imaging, and electron retardation mode. The variable pressure detector is designed to evaluate samples in studies such as aerospace and automotive applications. The variable pressure mode uses an adjustable vacuum to observe rugged and delicate samples even in challenging conditions and environment. The variable pressure detector's low dose rate greatly reduces the charging effects so it can preserve the samples' delicate structures. PHILIPS T20 SEM's dual vacuum mode enables researchers to examine non-conducting samples with ease and accuracy. The dual vacuum technology also allows for scanning a variety of samples, ranging from conductive to non-conductive materials. The flexible imaging system also provides for tiling capability for large scale sample analysis. The high resolution imaging capability of PHILIPS / FEI T20 SEM allows for detailed analysis of a range of samples from tiny circuits to large samples. The magnification range is from 5x to 300,000x. It also has an array of automated navigation and imaging features, such as fast sample scanning, atomic-level visualization, automatic image acquisition, and image stitching capabilities. The automated, real-time operation of FEI T20 SEM allows for processing a large number of samples in order to identify or characterize features of a specimen quickly and efficiently. The unit also records and stores all imaging data during the operation process and provides the user with image archiving, viewing, and analysis capabilities. Overall, PHILIPS Tecnai T20 SEM is an efficient and powerful imaging machine that provides detailed structures and composition of complex samples. Its versatility and capability to provide quality imaging for demanding applications makes it a popular choice for a variety of industries. It is truly a great tool for advanced research and imaging.