Used PHILIPS / FEI Tecnai TF20 #293748941 for sale

PHILIPS / FEI Tecnai TF20 is a versatile scanning electron microscope (SEM) designed for high-resolution imaging, analytical and compositional analysis of micro-structured materials. It is one of the most advanced SEM systems with a large selection of powerful analytical instruments. The instrument is equipped with a magnetic lens 20 kV, oxide-coated tungsten filament for dim and bright-field imaging. It is fitted with an Everhart-Thornley backscatter detector which allows simultaneous collection of both secondary and backscattered electrons which improves contrast between nanometer scale features. FEI Tecnai TF20 features a high-accuracy, automatic sample transfer equipment which enables precise alignment of specimen pieces and also allows parallel drift control. It also offers a large tilting and rotation sample-stage which allows specimen viewing across a wide range of angles. This is particularly beneficial in the imaging and analysis of fine microstructures and is ideal for nanostructure imaging, elemental mapping, and analytical scanning. PHILIPS TECNAI TF-20 offers a suite of advanced analytical instruments, making it a powerful tool for materials analysis. The energy dispersive spectroscopy (EDS) system uses an everhart-thornley 60-channel detector to identify and quantify elemental composition of specimens. Additionally, the unit uses a jEOL-yield EELS electron energy-loss spectroscopy machine which is capable of performing high-resolution core level spectroscopy of materials. For charge detection, FEI TECNAI TF-20 is fitted with a ViewPoint 5-D Scanning Charged Detector, providing complete charge level information. This detector is combined with the high-magnification capabilities of the SEM and is used to capture surface and subsurface information. PHILIPS / FEI TECNAI TF-20 offers a wide range of other functions, including Evercool cryo-specimen preparation and unioval heating and cooling stages to reduce thermal shock and further protect specimens during imaging. Automated functions such as drift compensation and auto-focus help to maintain consistent results and increase imaging speed. In addition to its analytical capabilities, TECNAI TF-20 offers a range of software functions. It is compatible with an extensive selection of image analysis and measurement software, and can be used with 3D stereo modeling and analysis software, allowing users to interactively measure and analyze 3D data sets. Overall, Tecnai TF20 is a powerful scanning electron microscope that offers a wide range of features and capabilities for materials analysis. With its impressive and versatile analytical capabilities, PHILIPS Tecnai TF20 is an ideal choice for research and commercial laboratories performing materials analysis and characterization.