Used PHILIPS / FEI TF30 #9384150 for sale
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ID: 9384150
Transmission Electron Microscope (TEM)
300kV
Detectors: FEG and HAADF
External scan control
USB Type hand panels
Main chiller
Objective chiller
Water rack.
PHILIPS / FEI TF30 is a high-performance scanning electron microscope (SEM). In the SEM, an electron beam is used to create images of samples in order to gain insight into their composition and structure. FEI TF30 has a variety of features that make it one of the more advanced SEMs available on the market. The main features of PHILIPS TF30 SEM include a variable pressure option. This allows for imaging specimens in both high and low vacuum environments. With the ability to range from 1 x 10-9 mbar to 5 x 10-1 mbar, TF30 is capable of imaging both non-conductive and conductive samples without the need of a liquid coating. The low pressure imaging is also useful for investigating air sensitive specimens since all of the non-vacuum components have aluminum seals as opposed to elastomer Orings. This allows for consistent sample transfer to the chamber without compromising the optimal state of the sample. In addition to being able to image air-sensitive samples, PHILIPS / FEI TF30 can image with a substantial range of accelerating voltages depending on the application it is being used for. The lowest setting is 100 Volts, and the highest is 30,000 Volts. This wide range allows the user to image both large and small samples at high resolution. The sample stage in FEI TF30 is a unique feature. It includes a motorized wafer exchange stage and a manual sample stage. This allows for quick sample exchange and a great stability. It is capable of containing up to 4" wafers, and can rotate up to 70°. The tilt range of the stage can also be adjusted from -68º to +70º. The high-resolution imaging capability of PHILIPS TF30 SEM is made possible by its SE2 detector. The SE2 detector is a solid-state detector that can detect electrons from the specimen and convert them into high-resolution images. The SE2 detector is made up of an array of 31 semi-convergence arcs that are capable of freezing electron beam movement and providing clear images. In summary, TF30 scanning electron microscope offers many features ideal for imaging samples at both low and high vacuum conditions. Its SE2 detector is equipped to create high-resolution images of specimens, and its sample stages are motorized and provide stability. The low and high voltage settings also make PHILIPS / FEI TF30 an excellent choice for a variety of applications.
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