Used PHILIPS / FEI TF30ST #9378650 for sale

PHILIPS / FEI TF30ST is a high-resolution scanning electron microscope (SEM) that provides outstanding resolution and image quality due to its state-of-the-art design. It offers advanced energy-dispersive X-ray (EDX) spectroscopy for elemental analysis and vacuum levels of 10-9 torr. FEI TF30ST has a field emission gun (FEG) which ensures the highest possible resolution with greater contrast, faster scans and better image quality. It additionally includes a high resolution Everhart-Thornley detector, allowing faster and higher-quality imaging and spectroscopy results. The SEM is also equipped with a large-area Everhart-Thornley detector for large-scale studies. PHILIPS TF30ST is also a customizable SEM, allowing users to tailor the system to their specific SEM needs. It comes with a number of adjustable SEM parameters like acceleration voltage, gun drift voltage, scanning speed and sample bias. The microscope is also equipped with a motorized stage and automatic sample changer, which provide high productivity. The microscope features a unique 3D Tomo mode which allows users to generate three dimensional images of a sample by combining the results of multiple scans. This 3D reconstruction technique provides unique insights into high-resolution images and can be used for studies in materials science, nanotechnology and biology. The SEM is also outfitted with a variety of accessories like a backscatter detector, a cryo-holder, heating stages, electron beam lithography, and X-ray high resolution cameras for high-resolution imaging and analysis. These features provide researchers with in-depth characterization of their samples. In summary, TF30ST is a powerful scanning electron microscope that offers users a large variety of analytical tools and image resolution, making it ideal for a wide range of fields including materials science, nanotechnology, biology, and other sciences. Its customizable parameters, 3D tomography mode, and assortment of other features make it a great tool for detailed sample characterization.