Used PHILIPS / FEI Titan 80-300 #293755050 for sale
URL successfully copied!
ID: 293755050
Transmission Electron Microscope (TEM)
Type: X-FEG
GATAN Orius SC1000B Camera
EFTEM and EELS GATAN Image filder
High tension: 80 kV - 300 kV
Monochromator: Wien filter
Energy resolution: < 0.1 eV
Pole piece: S-Twin
LORENTZ Lens
CS-Image corrector: CETCOR
Point resolution TEM: down to 0.08 nm (CS Corrected)
Point resolution STEM: 0.18 nm (Uncorrected)
Stage tilt: ±70°.
PHILIPS / FEI Titan 80-300 scanning electron microscope is a cutting edge piece of instrumentation designed to provide researchers with incredibly detailed measurements of their specimen. This model of electron microscope is a field emission SEM and has been designed to deliver unparalleled performance and image quality. It features a high-pressure chamber, a high-energy dual beam system, and an ultra-high resolution imaging sensitivity. FEI Titan 80-300 utilizes a source with a field emission gun (FEG) as its electron source, providing the necessary energy to create high resolution, high contrast images on the sample surface. The electron gun also maximizes electron throughput and delivers a wide range of magnification capabilities PHILIPS Titan 80-300 scanning electron microscope has a high pressure chamber that is capable of reaching pressures ranging from ultra high to low vacuum. Its pressure range allows for a variety of samples to be studied, including ones that are very delicate. This chamber also provides excellent control over the imaging environment. The high-energy dual beam system of the electron microscope provides superior dual imaging capabilities. The primary beam is used to detect and identify elements in the sample, while the secondary beam provides high contrast imaging and an extremely high resolution. The dual beam system also allows for precise analysis of microstructures and microprocesses, allowing for accurate measurements of size, shape, orientation and materials. Titan 80-300 scanning electron microscope has an ultra-high resolution imaging sensitivity that can reach atomic levels. This high resolution allows for ultra-high quality imaging of fine details in the sample surface. Additionally, this electron microscope features a temperature controlled stage that ensures accurate results, even in harsh environmental conditions. PHILIPS / FEI Titan 80-300 scanning electron microscope is a powerful tool for imaging and analysis of a variety of samples. Its high resolution imaging capabilities, robust feature set, and adjustable pressure environment make it an excellent choice for research purposes. With the included advanced software, it can be used to make precise measurements and detailed analyses of samples without requiring any additional equipment.
There are no reviews yet