Used PHILIPS / FEI Titan 80-300 #293777416 for sale

PHILIPS / FEI Titan 80-300 Scanning Electron Microscope (SEM) is a modern, high-performance apparatus designed to produce high-resolution images of a variety of samples. With its large working distance, excellent contrast and resolution capabilities, this instrument is ideal for both demanding inspection and research applications. In terms of optics, FEI Titan 80-300 SEM is equipped with an in-lens column, which ensures highly-defined imaging of small details with the highest possible resolution. The column features a field-emission gun, which boasts a very high current density and consequently offers enhanced resolution across all magnifications. The electron optics also allow for an extremely wide working distance, which enables users to manipulate larger objects for detailed imaging. In terms of sample manipulation capabilities, PHILIPS Titan 80-300 employs an automated X-Y stage for precise positioning; Thanks to this system, the user can select, assess and image a region of the sample with high accuracy. Moreover, the XY stage also comprises a sample holder mechanism that allows for quick sample exchange in combination with specimen depth mapping. Titan 80-300 is further equipped with both BSE and SE detectors that enhance the imaging capabilities of the SEM. The SE detector produces good-quality images that offer detailed information about the specimen's topography, while the BSE detector produces composition maps that can be used to identify different phases present in the specimen. Moreover, this SEM utilizes a backscatter electron detector that offers in-depth analysis for applications that require highEnergy X-ray images. PHILIPS / FEI Titan 80-300 provides sophisticated user-friendly features for efficient operation. For instance, the operator can access the latest upgrades and software applications developed by FEI for the SEM directly from the software, as they become available, making it easy to keep abreast of the latest advancements in technology. In addition, FEI Titan 80-300 SEM is designed to be compatible with various designing and imaging programs such as PHILIPS TEMPLEX software. In terms of stability, PHILIPS Titan 80-300 can maintain exceptional image quality and stability for long periods, making it ideal for research and educational purposes. Thanks to its built-in thermal and mechanical compensations, Titan 80-300 is highly-suited for applications involving specimen analysis over extended periods. In conclusion, PHILIPS / FEI Titan 80-300 Scanning Electron Microscope is a reliable and high-performance instrument that offers versatility and precision for a variety of research and clinical applications. With its large working distance, excellent resolution, automated XY stage and in-lens column, this SEM is the perfect tool for obtaining high-definition images of samples for demanding inspection applications.