Used PHILIPS / FEI Titan 80-300 #293817325 for sale

PHILIPS / FEI Titan 80-300 is a scanning electron microscope (SEM) designed for high-resolution imaging, elemental analysis, and x-ray imaging at high magnifications. It is a high-performance microscope that combines a large depth of field with a high resolution for imaging and analyzing materials down to the nanometer level. This makes it ideal for applications in a variety of fields, including materials science, biology, microelectronics, and semiconductor fabrication. FEI Titan 80-300 utilizes a high-resolution, monochromated electron source, tilted at 30° to reduce spherical aberration. This allows for better image clarity and large depth of field over a wide range of magnifications. The tension-free design of the SEM ensures stable imaging, while the long-term drift correction feature ensures that any color differences in the images are consistent over time. PHILIPS Titan 80-300 also features advanced backscatter imaging technology. This allows the user to view non-conductive materials at high resolution, by detecting electrons reflected from the surface of the material back towards the detector. This is ideal for imaging biological samples, such as bacteria and virus particles. Titan 80-300 also features x-ray capabilities. By detecting x-ray signals from the sample, the user can produce elemental maps and analyze the distribution of various elements in the sample. This is important for studying molecular composition, for instance in the area of semiconductor research and development. Finally, PHILIPS / FEI Titan 80-300 also offers a range of automated capabilities designed to improve throughput and reduce user fatigue. Automated image stitching functions, for example, can save researchers time when compiling images for large fields of view and automated specimen loading makes it easier to accurately position samples for imaging. In conclusion, FEI Titan 80-300 is a highly advanced scanning electron microscope with a variety of features and capabilities ideal for elemental analysis and imaging at the nanometer level. It is a powerful tool for researchers across a wide range of fields.