Used PHILIPS / FEI Titan 80-300 #9220220 for sale

PHILIPS / FEI Titan 80-300 is a scanning electron microscope (SEM) equipped with a field emission gun (FEG). This microscope is a powerful tool for analyzing samples in a range of fields, such as nanotechnology, materials science, and semiconductor research. FEI Titan 80-300 utilizes a state-of-the-art FEG electron source, featuring a tungsten filament that is up to five times more stable than other conventional SEM sources. This allows the microscope to produce sub-nanometer resolution images with low electron doses, making it ideal for sample analysis that requires minimal sample damage. The microscope offers a wide field of view, with the ability to scan up to 800 microns in free-space. It also includes both coaxial and environmental detectors, including backscatter, secondary electron, and X-ray detectors. The microscope also comes with advanced image analysis software that allows researchers to analyze complex structures with precision. The flexibililty of PHILIPS Titan 80-300 allows it to be easily configured for multiple imaging modes, including advanced STEM and SEM techniques such as dual-beam imaging, electrostatic imaging, and energy filtered imaging. In addition to imaging capabilities, Titan 80-300 also includes a sample chamber with vacuum compatibility up to 5 x 10-5 mbar, an EDS system for elemental analysis, and a scattering method for measuring the surface roughness and topography of samples. Overall, PHILIPS / FEI Titan 80-300 provides advanced imaging capabilities with sub-nanometer resolution and multiple imaging modes while preserving sample integrity. This powerful SEM is a versatile tool for characterizing and analyzing a variety of materials, making it a valuable asset for researchers.